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公开(公告)号:US3591479A
公开(公告)日:1971-07-06
申请号:US3591479D
申请日:1969-05-08
Applicant: IBM
Inventor: STERN EMANUEL
Abstract: THIN FILM RESISTORS WHICH ARE STABLE TO THERMAL AND ELECTRICAL STRESS ARE PREPARED. A METAL ALLOY IS DEPOSITED ONTO A SUBSTRATE IN A SPUTTERING ATMOSPHERE COMPRISED OF A PRE-DETERMINED MIXTURE OF ARGON AND OXYGEN. A DC BIAS POTENTIAL IN A RANGE OF -70 TO -250 VOLTS IS APPLIED TO THE SUBSTRATE DURING THE SPUTTERING OPERATION.
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公开(公告)号:DE1514079A1
公开(公告)日:1969-08-21
申请号:DEJ0029713
申请日:1965-12-24
Applicant: IBM
Inventor: GALE SMITH MERLIN , STERN EMANUEL
IPC: H01J37/34 , H01L21/263 , H01L21/60 , H01L21/768 , H01L23/48
Abstract: 1,111,438. Semiconductor devices. INTERNATIONAL BUSINESS MACHINES CORPORATION. 3 Dec., 1965 [28 Dec., 1964], No.51341/65. Heading H1K. A method of forming an electrical connection between conductors on opposite major faces of a semi-conductor wafer, e.g. for an integrated circuit, comprises forming an aperture through the wafer and degenerately doping the wall of the aperture. Apertures (39) are formed in an N type semi-conductor wafer 1, Fig. 2A (not shown), the wafer is thermally oxidized, and the major faces are photo-masked leaving a small annular area exposed round each aperture (39), Fig. 2B (not shown). The wafer is etched in hydrofluoric aoid to remove the oxide layers covering the walls of the apertures (39) and then exposed to an acceptor vapour to form degenerately doped P type regions (51) in the walls of the apertures (39), Fig. 2C (not shown). As shown, Fig. 2D, thin film conductors 53, 53a, 55, 55a are deposited on both the major faces of the wafer and are interconnected by the regions 51. Degenerate strips may be provided in the major surfaces of the wafer simultaneously and integrally with regions 51 to form connections to degenerately doped regions of some components. The apertures may be made by subjecting a masked wafer to a glow discharge in an atmosphere of argon, Fig. 1 (not shown). The mask may be of aluminium in which case a small amount of oxygen is introduced into the atmosphere so that during the discharge the aluminium is oxidized. Alternatively the apertures may be produced by etching, e.g. with gaseous hydrogen chloride, Figs. 3A to 3C (not shown). Since the etching produces tapered apertures the wafer is masked on the face opposite to that in which active and passive devices are to be formed to allow the maximum surface area for these components. The apertures may also be etched from both faces at once using masks with aligned windows.
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公开(公告)号:CA783832A
公开(公告)日:1968-04-23
申请号:CA783832D
Applicant: IBM
Inventor: STERN EMANUEL , SMITH MERLIN G
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公开(公告)号:CA817414A
公开(公告)日:1969-07-08
申请号:CA817414D
Applicant: IBM
Inventor: CASWELL HOLLIS L , STERN EMANUEL
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