Abstract:
PROBLEM TO BE SOLVED: To provide a disk drive device capable of suppressing the generation of noise in the case of recording and reproducing AV data and its controlling method. SOLUTION: This device sets an actuator control condition corresponding to the seek distance of a magnetic head, decides a distance when the magnetic head actually seeks and controls the actuator with the control condition corresponding the distance by controlling the seek of the magnetic head in the case of reading information recorded on a magnetic disk or writing information on the magnetic disk. For instance, the control shown in the diagram S1 is executed in the case of short stroke seek, the control shown in the diagram S2 is executed in the case of middle stroke seek, and the control shown in the diagram S3 is carried out in the case of long stroke seek.
Abstract:
PROBLEM TO BE SOLVED: To provide a hard disk drive that copes with various causes to occurrence of runaway of a magnetic head. SOLUTION: The hard disk drive is provided with a magnetic disk 2 on which servo information is stored, the magnetic head 4 that seeks on the magnetic disk 2 and reads or writes data while staying at a prescribed position, a voice coil motor 6 that moves the magnetic head 4 onto a prescribed position of the magnetic disk 2, and a position control means that supplies a drive current to the voice coil motor 6 on the basis of the servo information read by the magnetic head 4. The position control means is provided with a CPU 12 that outputs a speed control variable on the basis of the servo information, a DAC (digital/analog converter) 7, a VCM (Voice Coil Motor) driver 8, and a controller 10 that limits a drive speed of the voice coil motor 6 when a deviation is caused in an output timing of the speed control variable. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a film deposition device correctly measuring the change in film thickness by laser beam in-situ in the process of a film forming process of a wafer by a CVD method without being influenced by a deposited film at the inside of a quartz furnace. SOLUTION: The cap part 28 of a quartz furnace 1 in a CVD device is provided with a light guide, a laser beam 50 is introduced into the quartz furnace through the light guide, and a wafer is irradiated with the laser beam. Reflected laser beam from the wafer is taken out to the outside of the quartz furnace through the same light guide, and the change of the film thickness is measured based on the quantity of the reflected laser beam. In this way, the laser beam can be transmitted without passing through the wall of the quartz furnace, and the measurement of film thickness can correctly be executed without being influenced by deposits on the wall face of the quartz furnace.