公开(公告)号：DE3367124D1

公开(公告)日：1986-11-27

申请号：DE3367124

申请日：1983-02-01

Applicant: IBM

Inventor： GROOM JAY LOWRY ,  SMITH PATRICIA JOYCE ,  VAIR GARY GAIL

IPC: G01R31/28 ,  G01R13/28 ,  G01R31/319 ,  G06F11/22 ,  G06F11/267 ,  G06F11/32 ,  G01R31/00

Abstract: Testing apparatus monitors signals at selected test points in a tested device. An operator specifies sets of signals defining a display window during which all signals at the selected test points will be available to the operator for immediate or later examination. One set of signals defines the beginning of the window. Another set defines the end of the window, but only after other sets or conditions, also specified by the operator, occur. For each set, the operator specifies test points monitored, signal states expected and what happens when the expected states occur.

公开(公告)号：DE2509452A1

公开(公告)日：1975-09-18

申请号：DE2509452

申请日：1975-03-05

Applicant: IBM

Inventor： JOHNSON LARRY ALBIN ,  ROBINSON NEIL LLOYD ,  STRANG RICHARD HUBERT ,  VAIR GARY GAIL ,  RIDDLE STANLEY THOMAS ,  BROWER RALPH DOYLE

IPC: B24B49/00 ,  G11B5/187 ,  G11B5/39 ,  G11B33/10 ,  G11B5/22 ,  G11B5/42