LOGIC/ARRAY TESTER
    2.
    发明专利

    公开(公告)号:DE3267552D1

    公开(公告)日:1986-01-02

    申请号:DE3267552

    申请日:1982-06-02

    Applicant: IBM

    Abstract: A test system for testing circuits in integrated circuit chips includes a host computer for controlling the test system, and a plurality of blocks operable in parallel and each including a controller, storage for test programs and test data, and plurality of electronic units or pin electronics cards, one unit being associated with one of the pins of a device under test. Each of the electronic units include timing circuitry for timing its associated pin independent of the timing of any other electronics unit.

Patent Agency Ranking