公开(公告)号：DE3577481D1

公开(公告)日：1990-06-07

申请号：DE3577481

申请日：1985-09-10

Applicant: IBM

Inventor： CAVALIERE JOSEPH RICHARD ,  LAFAVE LAWRENCE EDWARD ,  FEINBERG IRVING ,  KRAUS CHARLES JOHN ,  MACK ALFRED ,  VALENTINE EDWARD HUBERT

IPC: G01R31/26 ,  G01R1/06 ,  G01R1/073 ,  G01R31/28

公开(公告)号：DE3267552D1

公开(公告)日：1986-01-02

申请号：DE3267552

申请日：1982-06-02

Applicant: IBM

Inventor： GRAF MATTHEW CHRISTOPHER ,  MUHLFELD HANS PETER ,  VALENTINE EDWARD HUBERT

IPC: G01R31/26 ,  G01R31/28 ,  G01R31/319 ,  H01L21/66 ,  G06F11/00

Abstract: A test system for testing circuits in integrated circuit chips includes a host computer for controlling the test system, and a plurality of blocks operable in parallel and each including a controller, storage for test programs and test data, and plurality of electronic units or pin electronics cards, one unit being associated with one of the pins of a device under test. Each of the electronic units include timing circuitry for timing its associated pin independent of the timing of any other electronics unit.