公开(公告)号：JPH1131399A

公开(公告)日：1999-02-02

申请号：JP10072198

申请日：1998-04-13

Applicant: IBM

Inventor： KIRIHATA TOSHIAKI ,  WAIT CHRISTOPHER

IPC: G01R31/28 ,  G01R31/3185 ,  G06F11/273 ,  G11C29/12 ,  H01L21/66 ,  G11C29/00

Abstract: PROBLEM TO BE SOLVED: To provide an integrated circuit chip and an electronic system in which a self-test system is incorporated, respectively. SOLUTION: An integrated circuit chip 1 comprises a function of a built-in self-test(BIST) and a non-volatile memory, and a BIST 2 can use a self-program. An electronic system comprises an integrated circuit chip including on-chip built-in self-test(BIST) and a non-volatile memory as well as an off(3)hip test target. The integrated circuit chip and the electronic system are especially useful to simplify a test of an electronic product in both of manufacturing and an actual site, necessity of a tester having a large size, complexity, and high speed in manufacturing environment is dissolved, and the system is made useful further when a simple electric power chuck is used instead of inserting a product.