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公开(公告)号:GB2602553A
公开(公告)日:2022-07-06
申请号:GB202116123
申请日:2021-11-10
Applicant: IBM
Inventor: JIAN XU , GUO QIANG HU , YUAN YUAN DING , FAN LI , JINFENG LI , JUN ZHU
IPC: B07C5/342
Abstract: A method for removing an anomaly 104A, 104B in a collection of material comprises receiving, by a processor, an image 108 of the collection of material having a plurality of objects 106, identifying the anomaly 104A, 104B from the plurality of objects 106, generating a bounding box 110A, 110B for the anomaly 104A, 104B, generating one or more picking points on the anomaly 104A, 104B, the one or more picking points being configured on at least one balance points of the anomaly 104A, 104B and removing the anomaly 104A, 104B from the collection of material based on the one or more picking points preferably via robotic means. The method may further comprise comparing the area of the bounding box 110A, 110B to a threshold area. If the area of the bounding box 110A, 110B is less than a threshold area and the one or more picking points are generated at the center of the bounding box 110A, 110B. If the area of the bounding box 110A, 110B exceeds a threshold area one or more segmentations of the anomaly are computed and analyzed.
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公开(公告)号:GB2600587A
公开(公告)日:2022-05-04
申请号:GB202200865
申请日:2020-06-12
Applicant: IBM
Inventor: FAN LI , GUO QIANG HU , SHENG NAN ZHU , JUN ZHU , JING CHANG HUANG , PENG JI , YUAN YUAN DING
Abstract: A method, a device and a computer program product for image processing are proposed. In the method, whether a first image indicates a defect associated with a target object is determined. In response to determining that the first image indicates the defect, a second image absent from the defect is obtained based on the first image. The defect is identified by comparing the first image with the second image. In this way, the defect associated with the target object in the image can be accurately and efficiently identified or segmented.
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