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公开(公告)号:ZA764477B
公开(公告)日:1978-03-29
申请号:ZA764477
申请日:1976-07-26
Applicant: IBM
IPC: H01L27/08 , H01L21/265 , H01L21/322 , H01L21/331 , H01L21/76 , H01L21/8222 , H01L27/06 , H01L27/092 , H01L29/08 , H01L29/167 , H01L29/73 , H01L29/78 , H01L
Abstract: The device structure is a bi-polar transistor having a region of inert atoms located in the collector adjacent to the base-collector junction. Another embodiment of the invention is a complementary insulated gate field effect transistor (IGFET) structure having N and P channel IGFETs with regions of implanted ions beneath the source and drain of one or both transistors, and/or annular regions projecting inwardly from the surface that surround or separate the different types of IGFETs.
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公开(公告)号:ZA7604477B
公开(公告)日:1978-03-29
申请号:ZA7604477
申请日:1976-07-26
Applicant: IBM
IPC: H01L27/08 , H01L21/265 , H01L21/322 , H01L21/331 , H01L21/76 , H01L21/8222 , H01L27/06 , H01L27/092 , H01L29/08 , H01L29/167 , H01L29/73 , H01L29/78 , H01L
CPC classification number: H01L21/26506 , H01L21/76 , H01L27/0921 , H01L29/0821 , H01L29/167 , Y10S148/024 , Y10S438/904
Abstract: The device structure is a bi-polar transistor having a region of inert atoms located in the collector adjacent to the base-collector junction. Another embodiment of the invention is a complementary insulated gate field effect transistor (IGFET) structure having N and P channel IGFETs with regions of implanted ions beneath the source and drain of one or both transistors, and/or annular regions projecting inwardly from the surface that surround or separate the different types of IGFETs.
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