PARS IMAGING METHODS
    1.
    发明申请

    公开(公告)号:US20220022752A1

    公开(公告)日:2022-01-27

    申请号:US17394919

    申请日:2021-08-05

    Abstract: A method for visualizing details in a sample including directing an excitation beam to an excitation location below a surface of the sample, to generate signals in the sample; directing an interrogation beam toward the excitation location of the sample; directing a signal enhancement beam to the sample, to raise a temperature of a portion of the sample by 5 Kelvin or less, compared to a temperature of the portion of the sample in absence of the signal enhancement beam; detecting a portion of the interrogation beam returning from the sample that is indicative of the generated signals.

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