中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

22 records (took 0.027 seconds)

    DEVICE AND METHOD FOR PERFORMING LENS-FREE IMAGING
    1.
    发明申请
    DEVICE AND METHOD FOR PERFORMING LENS-FREE IMAGING 审中-公开
    用于执行无镜像成像的装置和方法

    公开(公告)号：WO2016107849A1

    公开(公告)日：2016-07-07

    申请号：PCT/EP2015/081302

    申请日：2015-12-28

    Applicant: IMEC VZW

    Inventor： VERCRUYSSE, Dries ,  VAN DORPE, Pol ,  ROTTENBERG, Xavier ,  CLAES, Tom ,  STAHL, Richard

    IPC: G02B6/34 ,  G01N15/14 ,  G02B6/12

    CPC classification number: G02B6/34 ,  G01N15/1436 ,  G01N15/1484 ,  G02B6/12 ,  G02B2006/12107 ,  G03H1/0443 ,  G03H2001/0447

    Abstract: The invention relates to an imaging device (1) comprising a photonic integrated circuit (2). This photonic integrated circuit comprises an integrated waveguide (4) for guiding a light signal (5), a light coupler (8) optically coupled to the integrated waveguide (4) and adapted for directing the light signal (5) out of the plane of the waveguide (4) as a light beam (9), and a microfluidic channel (98) for containing an object (12) immersed in a fluid medium. The microfluidic channel is configured to enable, in operation of the device, illumination of the object by the light beam. The integrated circuit further comprises at least one imaging detector (11) positioned for imaging the object (12) illuminated by the light beam (9). The invention also relates to a corresponding method for imaging.

    Abstract translation: 本发明涉及一种包括光子集成电路（2）的成像装置（1）。 该光子集成电路包括用于引导光信号（5）的集成波导（4），光耦合到集成波导（4）的光耦合器（8），并且适于将光信号（5）引导出 作为光束（9）的波导（4）和用于容纳浸入流体介质中的物体（12）的微流体通道（98）。 微流体通道被配置为在装置的操作中使得能够通过光束照射物体。 集成电路还包括至少一个成像检测器（11），其定位成对由光束（9）照射的物体（12）成像。 本发明还涉及相应的成像方法。

    APPARATUS AND METHOD FOR PERFORMING IN-LINE LENS-FREE DIGITAL HOLOGRAPHY OF AN OBJECT
    2.
    发明申请
    APPARATUS AND METHOD FOR PERFORMING IN-LINE LENS-FREE DIGITAL HOLOGRAPHY OF AN OBJECT 审中-公开
    用于执行对象的在线无数字数字全息扫描的装置和方法

    公开(公告)号：WO2015082476A1

    公开(公告)日：2015-06-11

    申请号：PCT/EP2014/076270

    申请日：2014-12-02

    Applicant: IMEC VZW

    Inventor： STAHL, Richard ,  VANMEERBEECK, Geert ,  JAPALAYA, Murali ,  LAMBRECHTS, Andy

    IPC: G03H1/04 ,  H04N9/04

    CPC classification number: G03H1/0443 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/147 ,  G01N2015/1454 ,  G03H1/0404 ,  G03H1/0465 ,  G03H1/0486 ,  G03H1/0493 ,  G03H1/0866 ,  G03H2001/0212 ,  G03H2001/0428 ,  G03H2001/0447 ,  G03H2001/0452 ,  G03H2001/0497 ,  G03H2001/266 ,  G03H2210/12 ,  G03H2210/13 ,  G03H2222/14 ,  G03H2226/11 ,  G03H2240/62 ,  H04N5/332 ,  H04N9/045

    Abstract: An apparatus for performing in-line lens-free digital holography of an object, comprising: • - a single point light source (2) adapted for emitting coherent light; • - an image sensing device (5) adapted and arranged for recording interference patterns wherein • - the point light source comprises a broad wavelength spectrum light source and a pinhole structure, • - the image sensing device is adapted for receiving and recording, at the same moment in time, a plurality of interference patterns by a respective plurality of disjoint subsets of pixels (I, II, III, IV); • - the image sensing device comprises for each of the disjoint subsets of pixels, a respective narrow band wavelength filter positioned above each of the pixels of the disjoint subset of pixels, wherein a wavelength range of each narrow band wavelength filter falls within the broad wavelength spectrum of the point light source, these wavelength ranges of the narrow band wavelength filters being non-overlapping;

    Abstract translation: 一种用于执行物体的无镜头数字全息术的设备，包括： - 适于发射相干光的单点光源（2）; • - 适于和布置用于记录干涉图案的图像感测装置（5），其中•点光源包括宽波长光谱光源和针孔结构， - 图像感测装置适于接收和记录在 相同的时刻，通过相应的多个不相交的像素子集（I，II，III，IV）的多个干涉图案; •图像感测装置包括用于每个不相似像素的子集，位于像素不相交子像素的每个像素上方的相应窄带波长滤波器，其中每个窄带波长滤波器的波长范围落在宽波长范围内 点光源的光谱，窄带波长滤波器的这些波长范围是不重叠的;

    A METHOD AND AN IMAGING SYSTEM FOR HOLOGRAPHIC IMAGING
    3.
    发明申请
    A METHOD AND AN IMAGING SYSTEM FOR HOLOGRAPHIC IMAGING 审中-公开

    公开(公告)号：WO2018104517A1

    公开(公告)日：2018-06-14

    申请号：PCT/EP2017/082012

    申请日：2017-12-08

    Applicant: IMEC VZW

    Inventor： LIN, Ziduo ,  YURT, Abdulkadir ,  STAHL, Richard ,  VANMEERBEECK, Geert

    IPC: G03H1/04 ,  G03H1/00 ,  G03H1/02

    Abstract: A method for holographic imaging of an object (106) comprises: driving (302) a laser (102) using a current which is below a threshold current of the laser (102); illuminating (304) the object (106) using illumination light (104) output by the laser (102); and detecting (306) an interference pattern formed by object light, having interacted with the object (106), and reference light of the illumination light (104). An imaging system (100) for holographic imaging is also provided.

    AN IMAGING DEVICE FOR IN-LINE HOLOGRAPHIC IMAGING OF AN OBJECT
    5.
    发明申请
    AN IMAGING DEVICE FOR IN-LINE HOLOGRAPHIC IMAGING OF AN OBJECT 审中-公开

    公开(公告)号：WO2019057768A1

    公开(公告)日：2019-03-28

    申请号：PCT/EP2018/075343

    申请日：2018-09-19

    Applicant: IMEC VZW

    Inventor： YURT, Abdulkadir ,  STAHL, Richard ,  JAYAPALA, Murali ,  VANMEERBEECK, Geert

    IPC: G03H1/04 ,  G03H1/08 ,  G01N21/47 ,  G03H1/00 ,  G03H1/02

    Abstract: An imaging device for in-line holographic imaging of an object (110) comprises: a set of light sources (102), wherein each light source (102) is configured to output light in a confined illumination cone; an image sensor (120), which comprises a set of light-detecting elements (122) for detecting incident light, wherein the set of light sources (102) are configured to output light such that the confined illumination cone of each light source (102) illuminates a specific part of the object (110); and wherein the light-detecting elements (122) detect a plurality of interference patterns, wherein each interference pattern is formed by diffracted light from the object (110) originating from a single light source (102) and undiffracted light from the same single light source (102), wherein at least a sub-set of light-detecting elements (122) is arranged to detect light relating to not more than one interference pattern.

    A DEVICE FOR DETECTING PARTICLES IN AIR
    8.
    发明公开
    A DEVICE FOR DETECTING PARTICLES IN AIR 审中-公开

    公开(公告)号：EP3839479A1

    公开(公告)日：2021-06-23

    申请号：EP19218692.2

    申请日：2019-12-20

    Applicant: Imec VZW

    Inventor： VANMEERBEECK, Geert ,  LIN, Ziduo ,  YURT, Abdulkadir ,  STAHL, Richard ,  LAMBRECHTS, Andy

    IPC: G01N15/06 ,  G01N1/22 ,  G01N1/40 ,  G03H1/04

    Abstract: A device (1) for detecting particles in air; said device (1) comprising:
    a receiver (10) for receiving a flow of air (12) comprising particles (2);
    a particle capturing arrangement (20) configured to transfer the particles (2) from the flow of air (12) to a liquid for collection of a set of particles (2) in the liquid;
    a flow channel (30) configured to pass a flow of the liquid comprising the set of particles (2) through the flow channel;
    a light source (40) configured to illuminate the set of particles (2) in the flow channel, such that an interference pattern is formed by interference between light being scattered by the set of particles (2) and non-scattered light from the light source; and
    an image sensor (50) comprising a plurality of photo-sensitive elements (52) configured to detect incident light, the image sensor (50) being configured to detect the interference pattern.

    A COLLECTOR FOR COLLECTING PARTICLES IN AIR AND A DEVICE FOR DETECTING PARTICLES IN AIR
    9.
    发明公开
    A COLLECTOR FOR COLLECTING PARTICLES IN AIR AND A DEVICE FOR DETECTING PARTICLES IN AIR 审中-公开

    公开(公告)号：EP3839474A1

    公开(公告)日：2021-06-23

    申请号：EP19218696.3

    申请日：2019-12-20

    Applicant: Imec VZW

    Inventor： LIN, Ziduo ,  YURT, Abdulkadir ,  STAHL, Richard ,  VANMEERBEECK, Geert ,  LAMBRECHTS, Andy

    IPC: G01N1/22 ,  G01N15/02 ,  G01N15/06 ,  G01N15/14 ,  G01N1/28

    Abstract: A collector (60, 90, 100) for collecting particles (2) in air, said collector (60, 90, 100) comprising:
    a substrate (61), which is adapted to enable imaging of the particles (2);
    an adhesive layer (65) arranged on a collector side (62) of the substrate (61), said adhesive layer (65) being formed by an adhesive material;
    a protection element (67), which is configured to protect the adhesive layer (65) before collection of particles (2);
    wherein the collector (60, 90, 100) is configured to allow release of protection of the adhesive layer (65) by the protection element (67) to expose an adhesive surface (66) of the adhesive layer (65) to ambient air for collecting particles (2) on the adhesive surface (66); and
    wherein the collector (60, 90, 100) is further configured for presenting a particle sample carrier (70) having a smooth top surface (68) and a smooth bottom surface (69) for preventing light from being diffusely scattered by the particle sample carrier (70).

    AN IMAGING DEVICE FOR IN-LINE HOLOGRAPHIC IMAGING OF AN OBJECT
    10.
    发明公开
    AN IMAGING DEVICE FOR IN-LINE HOLOGRAPHIC IMAGING OF AN OBJECT 审中-公开

    公开(公告)号：EP3460585A1

    公开(公告)日：2019-03-27

    申请号：EP17192986.2

    申请日：2017-09-25

    Applicant: IMEC vzw

    Inventor： YURT, Abdulkadir ,  STAHL, Richard ,  JAYAPALA, Murali ,  VANMEERBEECK, Geert

    IPC: G03H1/04 ,  G03H1/08 ,  G01N21/47 ,  G03H1/00 ,  G03H1/02

    Abstract: An imaging device for in-line holographic imaging of an object (110) comprises: a set of light sources (102), wherein each light source (102) is configured to output light in a confined illumination cone; an image sensor (120), which comprises a set of light-detecting elements (122) for detecting incident light, wherein the set of light sources (102) are configured to output light such that the confined illumination cone of each light source (102) illuminates a specific part of the object (110); and wherein the light-detecting elements (122) detect a plurality of interference patterns, wherein each interference pattern is formed by diffracted light from the object (110) originating from a single light source (102) and undiffracted light from the same single light source (102), wherein at least a sub-set of light-detecting elements (122) is arranged to detect light relating to not more than one interference pattern.

Patent Agency Ranking