公开(公告)号：WO2016103272A1

公开(公告)日：2016-06-30

申请号：PCT/IN2015/000083

申请日：2015-02-13

Applicant: INDIAN INSTITUTE OF SCIENCE

Inventor： PROF. SIVA UMAPATHY ,  SANCHITA Sil ,  GAGAN Dhal ,  PROF. FREEK Ariese

IPC: G01N21/65 ,  G01J3/44

CPC classification number: G01N21/65 ,  G01B11/00 ,  G01J3/0221 ,  G01J3/027 ,  G01J3/0289 ,  G01J3/44 ,  G01J3/4412 ,  G01N21/4795 ,  G01N2201/0221 ,  G01N2201/06113 ,  G01N2201/0826 ,  G01N2201/0833

Abstract: The invention provides a method for chemical signature resolved detection of a concealed object within a system. The method includes irradiating the system at a plurality of positions with aplurality of electromagnetic radiation of specific wavelength; capturing a certain component of the scattered electromagnetic radiation from the object at a plurality of locations along various 3D planes around the system; obtaining a plurality of profiles from the captured component of the scattered electromagnetic radiation; filtering the profiles to obtain a chemical signature specific to the object; and resolving the chemical signatures to detect the concealed object, wherein, the step of detection includes determination of the shape, size and location of the object.

Abstract translation: 本发明提供了一种用于系统内隐蔽物体的化学特征解析检测的方法。 该方法包括在多个具有特定波长的电磁辐射的位置照射系统; 在围绕系统的各种3D平面的多个位置处捕获来自物体的散射电磁辐射的某一分量; 从所述散射电磁辐射的拍摄成分获得多个轮廓; 过滤轮廓以获得特定于物体的化学特征; 以及解析所述化学特征以检测所述隐藏对象，其中，所述检测步骤包括确定所述物体的形状，大小和位置。