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公开(公告)号：US09958267B2
公开(公告)日：2018-05-01
申请号：US14977628
申请日：2015-12-21
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor： Ludovic Angot , Kun-Lung Tseng , Yi-Heng Chou
CPC classification number: G01C3/08 , G01B11/026 , G01B11/0608 , G02B21/36 , G06T7/571 , G06T2207/10028 , G06T2207/10148 , H04N5/23245
Abstract: An apparatus and a method for dual mode depth measurement are provided. The apparatus is used for measuring a depth information of a specular surface in a depth from defocus (DFD) mode or measuring a depth information of a textured surface in a depth from focus (DFF) mode. The apparatus includes a light source, a controller, a processor, a lighting optical system, an imaging optical system, a beam splitter and a camera. The controller is for switching between the depth from defocus mode and the depth from focus mode. The lighting optical system is used to focus a light from the light source on an object surface in the depth from defocus mode, and the lighting optical system is used to illuminate the object surface with a uniform irradiance in the depth from focus mode.
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公开(公告)号：US09894255B2
公开(公告)日：2018-02-13
申请号：US14290126
申请日：2014-05-29
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor： Ludovic Angot , Chun-Te Wu , Wei-Yi Lee
CPC classification number: H04N5/2256 , G06T7/11 , G06T7/136 , G06T7/174 , G06T2207/10016 , G06T2207/10048 , G06T2207/10144 , H04N5/2354 , H04N5/332
Abstract: A method and a system for depth selective segmentation of an object are provided. The method comprises the following steps. An image is captured in an invisible domain of the optical spectrum by illuminating a scene of interest under an illumination corresponding to said invisible domain of the optical spectrum by an invisible light illumination unit. A binary mask is obtained from the image according to a threshold. Part of the image is eliminated by applying the binary mask to the image, and resulting in another image. The threshold is changed and another binary mask is obtained. The latest obtained binary mask is applied to the latest captured image. The step of changing of the threshold, the step of obtaining a mask and the step of applying the latest obtained binary mask on the latest captured image are performed at least once.
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公开(公告)号：US20220364848A1
公开(公告)日：2022-11-17
申请号：US17319107
申请日：2021-05-13
Applicant: Industrial Technology Research Institute
Inventor： Ludovic Angot , Ching-Han Yang
Abstract: A depth measurement apparatus including an illumination module, a beam splitter, an objective lens, an image capture module, a controller and a processor is provided. The illumination module is configured to generate an illumination beam. The beam splitter and the objective lens are disposed on an optical path of the illumination beam, and the object lens is configured to focus the illumination beam into a hole formed in an object. The image capture module is configured to capture images of the hole at different heights. The controller is coupled to the illumination module and the image capture module. The processor is coupled to the controller and the image capture module, and configured to perform focus distance evaluations on the images captured by the image capture module to obtain a height difference between two surfaces of the object. A depth measurement method is also provided.
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公开(公告)号：US09228829B2
公开(公告)日：2016-01-05
申请号：US14447354
申请日：2014-07-30
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor： Ludovic Angot , Chuan-Chung Chang
CPC classification number: G01B11/14 , G01S1/00 , G01S11/12 , G06K9/2018 , G06K9/2027 , G06K9/209 , G06K9/4604 , G06T7/55
Abstract: A method and a system for measuring a distance from a reference point to an object are provided. The method comprises the following steps. At least one image of an object is captured through a lens comprising a phase mask composed of a parallel plate and a wedge prism. At least two corresponding regions of interest (ROI) are obtained from the images. The regions of interest correspond to identical portions of the object. The relative coordinates between corresponding locations within the corresponding regions of interest is measured. The distance is calculated according to the relative coordinates.
Abstract translation: 提供了一种用于测量从参考点到物体的距离的方法和系统。 该方法包括以下步骤。 通过包括由平行板和楔形棱镜组成的相位掩模的透镜捕获物体的至少一个图像。 从图像中获得至少两个对应的感兴趣区域（ROI）。 感兴趣的区域对应于物体的相同部分。 测量相应的感兴趣区域内相应位置之间的相对坐标。 距离根据相对坐标进行计算。
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Patent Agency Ranking
公开(公告)号：US20150237325A1
公开(公告)日：2015-08-20
申请号：US14421716
申请日：2013-03-15
Inventor： Ludovic Angot , Wei-Jia Huang , Chun-Te Wu , Chia-Hang Ho
CPC classification number: H04N13/261 , A61B1/00009 , A61B90/361 , A61B2017/00725 , A61B2090/3614 , A61B2090/367 , G06T7/579 , G06T2207/10012 , G06T2207/10024 , G06T2207/10068 , G06T2207/30004 , H04N13/221 , H04N13/271
Abstract: A method of converting 2D images to 3D images and system thereof is provided. According to one embodiment, the method comprises receiving a plurality of 2D images from an imaging device; obtaining motion parameters from a sensor associated with the imaging device; selecting at least two 2D images from the plurality of 2D images based on the motion parameters; determining a depth map based on the selected 2D images and the motion parameters corresponding to the selected 2D images; and generating a 3D image based on the depth map and one of the plurality of 2D images.
Abstract translation: 提供了一种将2D图像转换为3D图像的方法及其系统。 根据一个实施例，该方法包括从成像设备接收多个2D图像; 从与所述成像装置相关联的传感器获得运动参数; 基于所述运动参数从所述多个2D图像中选择至少两个2D图像; 基于所选择的2D图像和对应于所选择的2D图像的运动参数来确定深度图; 以及基于所述深度图和所述多个2D图像之一生成3D图像。
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6.发明授权公开(公告)号：US10571252B2
公开(公告)日：2020-02-25
申请号：US16036952
申请日：2018-07-17
Applicant: Industrial Technology Research Institute
Inventor： Ludovic Angot , Yueh-Yi Lai
Abstract: A surface topography optical measuring system including image capture modules, a control module and a computation module is provided. Each image capture module includes an electronically controlled focal length tunable lens, an optical assembly and an image sensor, wherein the image capture modules respectively capture images at different heights between a lowest and a highest surfaces of an object. The control module is coupled to the image capture modules to independently control the image capture modules. The computation module is coupled to the control module and the image sensor of each image capture module, wherein the computation module perform calibration of the surface topography optical measuring system and assesses in-focused pixels in the captured images to measure a height difference between a highest and a lowest surfaces of the object or between any surfaces of interest of the object. A surface topography optical measuring method is also provided.
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7.发明申请公开(公告)号：US20200025555A1
公开(公告)日：2020-01-23
申请号：US16036952
申请日：2018-07-17
Applicant: Industrial Technology Research Institute
Inventor： Ludovic Angot , Yueh-Yi Lai
Abstract: A surface topography optical measuring system including image capture modules, a control module and a computation module is provided. Each image capture module includes an electronically controlled focal length tunable lens, an optical assembly and an image sensor, wherein the image capture modules respectively capture images at different heights between a lowest and a highest surfaces of an object. The control module is coupled to the image capture modules to independently control the image capture modules. The computation module is coupled to the control module and the image sensor of each image capture module, wherein the computation module perform calibration of the surface topography optical measuring system and assesses in-focused pixels in the captured images to measure a height difference between a highest and a lowest surfaces of the object or between any surfaces of interest of the object. A surface topography optical measuring method is also provided.
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公开(公告)号：US11162784B2
公开(公告)日：2021-11-02
申请号：US16729499
申请日：2019-12-30
Applicant: Industrial Technology Research Institute
Inventor： Ludovic Angot , Yueh-Yi Lai
Abstract: System and method for profile measurement are provided. The profile measurement system includes a light projector, an imaging device, a control system, and a processing unit. The light projector includes a light source, a mask, and an optical system. An aperture of the mask allows a portion of light to pass through and generates a pattern. The optical system includes a variable focal length lens element configured to project the pattern at different projection distances. The imaging device is configured to capture images of the pattern projected at the different projection distances. The control system is configured to control a projection distance of the light projector and a focus distance of the imaging device. The processing unit is configured to obtain in-focus pixels in the captured images, generate mask images, reconstruct a large depth of field pattern image based on the captured images and reconstruct the object profile.
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公开(公告)号：US20210199425A1
公开(公告)日：2021-07-01
申请号：US16729499
申请日：2019-12-30
Applicant: Industrial Technology Research Institute
Inventor： Ludovic Angot , Yueh-Yi Lai
Abstract: System and method for profile measurement are provided. The profile measurement system includes a light projector, an imaging device, a control system, and a processing unit. The light projector includes a light source, a mask, and an optical system. An aperture of the mask allows a portion of light to pass through and generates a pattern. The optical system includes a variable focal length lens element configured to project the pattern at different projection distances. The imaging device is configured to capture images of the pattern projected at the different projection distances. The control system is configured to control a projection distance of the light projector and a focus distance of the imaging device. The processing unit is configured to obtain in-focus pixels in the captured images, generate mask images, reconstruct a large depth of field pattern image based on the captured images and reconstruct the object profile.
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