TOPOLOGICAL INSULATOR FORMED NEW SURFACE ELECTRONIC STATE AND THE PREPARATION METHOD THEREOF
    1.
    发明申请
    TOPOLOGICAL INSULATOR FORMED NEW SURFACE ELECTRONIC STATE AND THE PREPARATION METHOD THEREOF 审中-公开
    拓扑绝缘子形成新表面电子状态及其制备方法

    公开(公告)号:US20160111643A1

    公开(公告)日:2016-04-21

    申请号:US14886736

    申请日:2015-10-19

    CPC classification number: H01L49/006 B82Y10/00

    Abstract: The disclosure describes a topological insulator having a new surface electronic state and a preparation method thereof, and more particularly, to a topological insulator having a new surface electronic state, the topological insulator including a unimolecular metal layer formed on a 3D topological insulator, and a method of preparing a topological insulator having a new surface electronic state, the method including: heating and cooling at least one selected from the group consisting of tellurium (Te) and selenium (Se), and bismuth (Bi) to prepare an alloy; and forming a unimolecular metal layer on the alloy.

    Abstract translation: 本发明描述了具有新的表面电子状态的拓扑绝缘体及其制备方法,更具体地,涉及具有新的表面电子状态的拓扑绝缘体,所述拓扑绝缘体包括形成在3D拓扑绝缘体上的单分子金属层,以及 制备具有新的表面电子状态的拓扑绝缘体的方法,该方法包括:加热和冷却选自碲(Te)和硒(Se)和铋(Bi)中的至少一种以制备合金; 并在合金上形成单分子金属层。

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