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1.Testing device using sampling unit operated at low temperat-ure 失效
Title translation: 使用在低温下运行的采样单元的测试设备公开(公告)号:JPS5975687A
公开(公告)日:1984-04-28
申请号:JP13111983
申请日:1983-07-20
Applicant: Ibm
Inventor: SADEGU MUSUTAAFUA FUARISU , POORU ANDORIYUU MOSUKOUITSUTSU , AASAA DABITSUDOSON , JIYOOJI ANSONII SAIIHARASUZU
CPC classification number: G01R31/2822 , F17C13/00 , F17C2203/0391 , F17C2203/0629 , F17C2223/0161 , F17C2250/0631 , F17C2270/0168 , F17C2270/0509 , F17C2270/0518 , Y10S505/843