公开(公告)号：JP2005077417A

公开(公告)日：2005-03-24

申请号：JP2004256381

申请日：2004-09-03

Applicant: Jobin Yvon Sas ,  ジョビン イボン エス. アー. エス.

Inventor： FRETEL EMMANUEL ,  DANTHEZ YVES ,  WALLERAND CATHERINE ,  MIRZA ARSHAD

IPC: G01J3/02 ,  G01J1/44 ,  G01J3/28

CPC classification number: G01J3/2803 ,  G01J1/44

Abstract: PROBLEM TO BE SOLVED: To provide a method and a system for spectrometry which simultaneously can analyze a plurality of signals which differ in intensities by a large amount. SOLUTION: The method and a system for spectrum spectrometry of light beam consisting of a luminous flux set different in central wavelength are provided. A light beam is dispersed on an imaging device contained in this system comprising matrix of a photodetector with active column to detect the luminous flux of the light beam. The orientation of this imaging device is determined so as to assign one wavelength to the line of the photodetector. Both the an exposure time τi required to measure the maximum intensity Imax for each luminous flux and submatrix Mi of the photodetector matrix related to luminous flux are defined. Then an exposure time τ'i which serves as a divisor of maximum integer for a total integration time T smaller than τi is assigned to the submatrix Mi of the photodetector. For each τ'i during the spectrum integration time T, corresponding submatrix Mi which is independent of the other submatrix Mj (j≠i) is measured and reset, and this time T is used to measure spectrum of the beam. COPYRIGHT: (C)2005,JPO&NCIPI

Abstract translation: 要解决的问题：提供一种同时可以大量分析强度不同的多个信号的光谱测定方法和系统。 解决方案：提供由不同于中心波长的光束组成的光束的光谱分析方法和系统。 光束分散在包含在该系统中的成像装置中，该系统包括具有有源列的光电检测器的矩阵，以检测光束的光通量。 该成像装置的取向被确定为将一个波长分配给光电检测器的线。 定义了与光通量相关的光电检测器矩阵的每个光通量和子矩阵Mi测量最大强度Imax所需的曝光时间τi。 然后，对于小于τi的总积分时间T，作为最大整数的除数的曝光时间τ'i被分配给光电检测器的子矩阵Mi。 对于频谱积分时间T期间的每个τ'i，测量和复位独立于另一子矩阵Mj（j≠i）的相应子矩阵Mi，并且此时间T用于测量波束的频谱。 版权所有（C）2005，JPO＆NCIPI

公开(公告)号：FR2859279A1

公开(公告)日：2005-03-04

申请号：FR0350497

申请日：2003-09-03

Applicant: JOBIN YVON SAS

Inventor： FRETEL EMMANUEL ,  DANTHEZ YVES ,  WALLERAND CATHERINE ,  MIRZA ARSHAD

IPC: G01J3/02 ,  G01J1/44 ,  G01J3/28 ,  G01J3/457 ,  H04N3/15

Abstract: A device and a method for spectroscopic measurement of the spectrum of a light beam. The method includes detecting the dispersed light fluxes of the beam on an imaging device comprising a matrix of photodetectors with active columns, directing the imaging device so that one wavelength is allocated to a line of photodetectors, determining for each light flux the exposure time tau i necessary to measure a maximal intensity I max and the sub-matrix M i of photodetectors associated with the light fluxes, allocating to the sub-matrix M i of photodetectors an exposure time tau' i so that tau' i is the largest integer divider of the total integration time T smaller than tau i , measuring and resetting, during the integration time T of said spectrum, at each time tau' i , the corresponding sub-matrix M i independently of the other sub-matrices M j with j<>i, and measuring the spectrum of the beam at the time T.

公开(公告)号：FR2859279B1

公开(公告)日：2005-11-25

申请号：FR0350497

申请日：2003-09-03

Applicant: JOBIN YVON SAS

Inventor： FRETEL EMMANUEL ,  DANTHEZ YVES ,  WALLERAND CATHERINE ,  MIRZA ARSHAD

IPC: G01J3/02 ,  G01J1/44 ,  G01J3/28 ,  G01J3/457 ,  H04N3/15

Abstract: A device and a method for spectroscopic measurement of the spectrum of a light beam. The method includes detecting the dispersed light fluxes of the beam on an imaging device comprising a matrix of photodetectors with active columns, directing the imaging device so that one wavelength is allocated to a line of photodetectors, determining for each light flux the exposure time tau i necessary to measure a maximal intensity I max and the sub-matrix M i of photodetectors associated with the light fluxes, allocating to the sub-matrix M i of photodetectors an exposure time tau' i so that tau' i is the largest integer divider of the total integration time T smaller than tau i , measuring and resetting, during the integration time T of said spectrum, at each time tau' i , the corresponding sub-matrix M i independently of the other sub-matrices M j with j<>i, and measuring the spectrum of the beam at the time T.