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公开(公告)号：HU183954B
公开(公告)日：1984-06-28
申请号：HU186882
申请日：1982-06-09
Applicant: KOEZPONTI ELELMISZERIPARI
Inventor： KAFFKA KAROLY , NADAI BELA , CZABAFFY ANDRAS , HORVATH LORAND
Abstract: The invention relates to a grating monochromator for providing monochromatic radiation the wavelength of which is linearly proportional to a translation or rotation, said monochromator comprising an optical device including a reflection grating (1), an entrance slit transmitting a beam onto the optical device, an exit slit (5) transmitting the beam reflected by the optical device, and a mechanism for moving the optical device and at least one of the slits with respect to each other. Within said monochromator the moving mechanism is constructed so that in the course of the moving both the entrance slit and the exit slit (5) are always positioned along a Rowland-circle (R) related to the optical device including the grating (1), and there is a transducer (42) producing an output signal corresponding to the current wavelength value, said transducer (42) being connected to a member (33) translating or rotating proportionally to a distance between a point (A) of the Rowland-circle (R) lying diametrically opposite to the optical device and said at least one slits. The moving mechanism expediently comprises means (41, 33) for altering the distance between said points (A) of the Rowland-circle (R) lying diametrically opposite to the optical device and said at least one slit, and said member (33) translating or rotating proportionally to said distance is a part of said means.
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Patent Agency Ranking
公开(公告)号：HU186069B
公开(公告)日：1985-05-28
申请号：HU186982
申请日：1982-06-09
Applicant: KOEZPONTI ELELMISZERIPARI
Inventor： CZABAFFY ANDRAS , HORVATH LORAND , KAFFKA KAROLY , NADAI BELA
Abstract: The invention relates to a spectrophotometer operating at discrete wavelengths comprising means to emit variable, substantially monochromatic radiation for irradiating a sample (10) to be tested, a radiation detector (12) sensing the intensity of the radiation reflected or transmitted by the sample (10) and a signal processing unit connected to the radiation detector (12). The radiation emitting means comprises radiation sources (2) emitting substantially monochromatic radiation of different wavelengths, a holder (1) supporting the radiation sources (2) and an optical arrangement (5,6) for transmitting the radiation emitted by the radiation sources (2) successively towards the sample (10). The optical arrangement may comprise at least one mirror (5) supported rotatably with respect to the holder (1). The spectrophotometer is preferably provided with a control unit (3) to operate the radiation sources (2) corresponding to the angular position of said at least one mirror (5), thereby only that one of the radiation sources (2) is operating the radiation of which is just transmitted by the mirror (5).
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公开(公告)号：HU187188B
公开(公告)日：1985-11-28
申请号：HU379182
申请日：1982-11-25
Applicant: KOEZPONTI ELELMISZERIPARI
Inventor： NADAI BELA , CZABAFFY ANDRAS , HORVATH LORAND , KAFFKA KAROLY
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公开(公告)号：HU183949B
公开(公告)日：1984-06-28
申请号：HU183082
申请日：1982-06-07
Applicant: KOEZPONTI ELELMISZERIPARI
Inventor： NADAI BELA , CZABAFFY ANDRAS , HORVATH LORAND , KAFFKA KAROLY
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公开(公告)号：HU183889B
公开(公告)日：1984-06-28
申请号：HU113982
申请日：1982-04-14
Applicant: KOEZPONTI ELELMISZERIPARI
Inventor： CZABAFFY ANDRAS , HORVATH LORAND , KAFFKA KAROLY , NADAI BELA
Abstract: The invention provides on the one hand a method for measuring the spectrum of a material, wherein a sample (10) of the material to be tested is irradiated with a radiation of required wavelengths and the spectrum signals produced by an intensity measuring unit (34) as a result of the radiation reflected or transmitted by the sample (10) are measured. According to the present invention, a zero level signal produced by the intensity measuring unit (34) in a unradiated condition is measured and the measured zero level value is stored, then one or more spectrum signal measurements are performed at at least one wavelength and the measured one or more spectrum values are stored, then the zero level signal produced by the intensity measuring unit (34) is measured again in an unradiated condition and its value is stored, then preferably said one or more spectrum signal measurements at at least one wavelength prescribed and said storage of the measured values as well as said zero level signal measurement and said storage of the measured value are repeated as many times as required, and finally the stored spectrum values are modified by correction values generated on the basis of the stored zero level values. On the other hand the invention is an apparatus for measuring the spectrum of a material comprising a controllable monochromator (1) emitting a radiation of a required wavelength onto a sample (10) of the material to be tested, an intensity measuring unit (34) provided with a sensor (11) sensitive to the radiation reflected or transmitted by the sample (10), a data processing unit (14) connected to the intensity measuring unit (34) via an analog-to-digital converter (13), and a control unit controlling the analog-to-digital converter (13) synchronously with the monochromator (1) while irradiating the sample (10) with the radiation of the required wavelength. According to the invention the control unit comprises means (17, 7, 27, 29, 21, 19) to provide at least one start signal onto a control input (31) of the analog-to-digital converter (13) prior to and/or after the period of irradiating the sample (10) with the radiation of the required wavelength.
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公开(公告)号：HU188795B
公开(公告)日：1986-05-28
申请号：HU173382
申请日：1982-05-28
Applicant: KOEZPONTI ELELMISZERIPARI
Inventor： KAFFKA KAROLY , NADAI BELA , CZABAFFY ANDRAS , HORVATH LORAND
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