公开(公告)号：KR20120067676A

公开(公告)日：2012-06-26

申请号：KR20100129212

申请日：2010-12-16

Applicant: KOREA ELECTRONICS TECHNOLOGY

Inventor： JANG JIN MO

IPC: G01R31/26 ,  H01L21/66

Abstract: PURPOSE: A semiconductor device test system and a current summing apparatus included in the same are provided to offer enough current by adding supply currents and supplying it to a test target semiconductor device. CONSTITUTION: A semiconductor test device(100) sources and sinks a current with a pin of a test target semiconductor device. A current summing apparatus adds supply currents of partial power unit among a plurality of power units and supplies added supply currents to the test target semiconductor device. Forward direction current route units(310) are respectively connected to different power unit and are equally connected with the pin. Backward current route units(320) are parrallely connected with the forward direction current route units.

Abstract translation: 目的：提供包括在其中的半导体器件测试系统和电流求和装置，以通过增加电源电流并将其提供给测试目标半导体器件来提供足够的电流。 构成：半导体测试装置（100）利用测试目标半导体器件的引脚来源和吸收电流。 电流求和装置将多个功率单元之间的部分功率单元的电源电流相加，并向所述测试对象半导体器件供给相加的电源电流。 正向电流路径单元（310）分别连接到不同的功率单元并且与引脚等效连接。 向后的当前路径单元（320）与前向当前路由单元并行连接。