公开(公告)号：US10309011B2

公开(公告)日：2019-06-04

申请号：US15562545

申请日：2016-07-28

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Sang Woo Kang ,  Ji Hun Mun

IPC: C01B17/20 ,  C01G39/06 ,  C23C16/02 ,  C23C16/30 ,  C23C16/52 ,  C30B25/16 ,  C30B25/18 ,  C30B29/46 ,  C30B29/64 ,  C23C16/455

Abstract: The present invention relates to a method for preparing a two-dimensional transition metal dichalcogenide and, more particularly, to a method for preparing a highly uniform two-dimensional transition metal dichalcogenide thin film. More specifically, the present invention is directed to a preparation method for a highly uniform two-dimensional transition metal dichalcogenide thin film at low temperature of 500° C. or below.

公开(公告)号：US12085496B2

公开(公告)日：2024-09-10

申请号：US17763279

申请日：2021-08-10

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Ji Hun Mun ,  Sang Woo Kang

IPC: G01N15/14 ,  G01N15/1429

CPC classification number: G01N15/1429 ,  G01N2015/1486 ,  G01N2015/1493

Abstract: The present invention relates to particle measuring apparatus and a particle measuring method, whereby particle counts per size range can be measured with a high accuracy using a laser power scanning in which lasers of several powers are sequentially irradiated. First, minimum powered lasers capable of measuring particles having more than relevant size are irradiated to a particle measurement space for a predetermined time in response to plural counts of each mutually different particle size, and the counts of particles per size are measured by detecting a scattered light. Furthermore, the counts of particles belonging to each size range can be accurately calculated through an algorithm using the actually measured value.