公开(公告)号：EP4435424A1

公开(公告)日：2024-09-25

申请号：EP22895919.3

申请日：2022-11-03

Applicant: Korea Basic Science Institute

Inventor： KIM, Dong Uk ,  CHANG, Ki Soo ,  JEONG, Chan Bae ,  HAN, Il Kyu

IPC: G01N25/20 ,  G01J5/00 ,  G01J5/08

CPC classification number: G01J5/08 ,  G01N25/20 ,  G01J5/00

Abstract: A device and a method for measuring a time-resolved thermal image are disclosed. An embodiment comprises an optical imaging unit comprising a camera and a probe light source, the optical imaging unit emitting a probe optical signal from the probe light source to a sample during a time-resolution time; a control unit for outputting a first trigger signal to the camera, outputting a driving signal to the probe light source such that the probe light source emits the probe light source to the sample during the time-resolution time, outputting a second trigger signal to a bias unit in an turn-on interval, and outputting no second trigger signal to the bias unit in a turn-off interval; and a bias unit for applying a bias signal generated on the basis of the second trigger signal in the turn-on interval to the sample, and applying no bias signal to the sample in the turn-off interval. The camera generates a first reflection image of the sample by using a signal reflected from the sample when the probe optical signal is emitted to the sample during the time-resolution time in the turn-on interval. The camera generates a second reflection image of the sample by using a signal reflected from the sample when the probe optical signal is emitted to the sample during the time-resolution time in the turn-off interval. The control unit generates a time-resolved thermoreflectance image of the sample on the basis of the generated first and second reflection images.