Abstract:
A high throughput apparatus for multiple sample analysis is disclosed. The high through apparatus for multiple sample analysis may include: a laser light source; a lens array configured to focus laser irradiated by the laser light source into a plurality of focused laser beams; and a focusing unit disposed between the lens array and a sample, the focusing unit configured to focus ions produced from the sample by the plurality of focused laser beams into a plurality of ion beams. A high throughput method for multiple sample analysis may include: producing a plurality of focused laser beams by focusing laser; ionizing a sample by irradiating the plurality of focused laser beams to the sample; and producing a plurality of ion beams by focusing ions, wherein the ions are produced from the sample by the plurality of focused laser beams.