公开(公告)号：US20210404797A1

公开(公告)日：2021-12-30

申请号：US16651792

申请日：2019-07-29

Applicant: Korea Research Institute of Standards and Science

Inventor： Young-Sik GHIM ,  The Manh NGUYEN ,  Hyug-Gyo RHEE

IPC: G01B11/25

Abstract: The present disclosure is related to a system and a method for 3D shape measurement of a freeform surface based on high-speed deflectometry using composite patterns. More particularly, a system for profile measurement based on high-speed deflectometry using composite patterns includes: a composite pattern generation part to project a composite pattern generated by synthesizing patterns having different frequencies to a measurement object; a detector to acquire images of a deformed composite pattern reflected from the measurement object; and a phase acquisition part to acquire wrapped phases by each frequency from the composite pattern and unwrapped phases from the respective wrapped phases.