REFRACTIVELY SCANNED INTERFEROMETER
    1.
    发明申请
    REFRACTIVELY SCANNED INTERFEROMETER 审中-公开
    简洁的扫描干涉仪

    公开(公告)号:WO1981000299A1

    公开(公告)日:1981-02-05

    申请号:PCT/US1980000936

    申请日:1980-07-18

    CPC classification number: G01J3/4537

    Abstract: An interference spectrometer in which a wedge-shaped prism (32) is moved across one arm (22) of an interferometer for variation of the path difference, and where the beam splitter substrate (36) and prism (32) are optically compensated for by elements substantially identical to the substrate and prism (38, 40) in the other arm of the interferometer. In a first embodiment two refractive elements are in each arm of the interferometer (40, 36, 38, 32). In the preferred embodiment, only one prism is used in each arm, (46, 44) with the beam splitter surface (12) being located on a fixed prism (46), in one arm, adjacent a movable prism (44) in the other arm.

    Abstract translation: 一种干涉光谱仪,其中楔形棱镜(32)跨过干涉仪的一个臂(22)移动以改变路径差异,并且其中分束器基板(36)和棱镜(32)被光学补偿 元件基本上与干涉仪的另一臂中的基板和棱镜(38,40)相同。 在第一实施例中,两个折射元件在干涉仪(40,36,38,32)的每个臂中。 在优选实施例中,在每个臂(46,44)中仅使用一个棱镜,其中分束器表面(12)位于一个臂中的固定棱镜(46)上,邻近可动棱镜(44) 其他手臂

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