SINGLE EVENT UPSET IMMUNE FLIP-FLOP UTILIZING A SMALL-AREA HIGHLY RESISTIVE ELEMENT

    公开(公告)号:WO2021061170A1

    公开(公告)日:2021-04-01

    申请号:PCT/US2019/061469

    申请日:2019-11-14

    Abstract: An SEU immune flip-flop includes a master stage data latch, being transparent in response to a clock signal first state and being latched in response to a clock signal second state; a slave stage data latch; and a scan slave latch having an input coupled to the slave stage data latch scan output, being transparent in response to the clock signal second state and being latched in response to the clock signal first state. The slave stage data latch includes a switched inverter disabled when the slave latch is in a transparent state and enabled when the slave latch is in a latched state having a time delay longer than an SEU time period.

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