公开(公告)号：WO2021118869A1

公开(公告)日：2021-06-17

申请号：PCT/US2020/063215

申请日：2020-12-04

Applicant: MICROCHIP TECHNOLOGY INC.

Inventor： RAMAN, Madhusudan ,  DUNOYER, Julien G. ,  ABDALLAH, Nizar

IPC: G06F30/27 ,  G06F30/3312 ,  H01L21/66 ,  G06F119/12

Abstract: A method for integrated circuit design with delay verification includes storing configuration files for a slew-rate Machine Learning (ML) model, a net-delay ML model and a cell-delay ML model. A user design is received, slew-rate feature values, net-delay feature values and cell-delay feature values are extracted from the user design, the configuration files are loaded to form inference cores, and operations of the slew-rate inference core are performed to calculate predicted slew-rate values that are sent to ML design tools. Operations of the net-delay inference core are performed to calculate predicted net-delay values that are sent to the ML design tools. Operations of the cell-delay inference core are performed to generate predicted cell-delay values that are sent to the ML design tools. The user design is iterated until a user design is obtained that is free of timing violations.