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公开(公告)号：JPS629271A
公开(公告)日：1987-01-17
申请号：JP15285486
申请日：1986-07-01
Applicant: MILES LAB
Inventor： SUTEIIBUN SHII CHIYAARUTON , ROJIYAA ERU FUREMINGU , POORU HEMUSU , AASAA ERU WAI ROO
IPC: G01N31/00 , G01J20060101 , G01N20060101 , G01N31/22
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公开(公告)号：JPS59212457A
公开(公告)日：1984-12-01
申请号：JP9313284
申请日：1984-05-11
Applicant: Miles Lab
Inventor： SUTEIIBUN SHII CHIYAARUTON , ROJIYAA ERU FUREMINGU , AASAA ERU WAI ROO
IPC: C07C251/20 , C07C67/00 , C07C241/00 , C07C249/02 , C07C251/22 , G01N33/84 , C07C119/14
CPC classification number: G01N33/84
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3.发明专利Test means and testing tool for measuring ion in test sample, and measuring method using these means and tool 失效用于测试样品中测量离子的测试手段和测试工具，以及使用这些手段和工具的测量方法
公开(公告)号：JPS59211864A
公开(公告)日：1984-11-30
申请号：JP9313484
申请日：1984-05-11
Applicant: Miles Lab
Inventor： SUTEIIBUN SHII CHIYAARUTON , ROJIYAA ERU FUREMINGU , AASAA ERU WAI ROO , POORU HEMUZU
IPC: C07C37/50 , C07C45/46 , C07C45/68 , C07C51/347 , C07C57/30 , C07C59/84 , C07C251/22 , C07D323/00 , C07D498/08 , G01N21/78 , G01N31/00 , G01N31/22 , G01N33/52 , G01N33/76 , G01N33/84
CPC classification number: C07D498/08 , C07C37/50 , C07C45/46 , C07C45/68 , C07C51/347 , C07C57/30 , C07C59/84 , C07D323/00 , G01N31/22 , G01N31/221 , G01N33/52 , G01N33/521 , G01N33/84 , Y10T436/25125 , C07C49/67 , C07C49/747 , C07C39/14
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