Abstract:
A memory array having improved isolation between the bit sense common lines (22, 23, 26, 27) is provided by using diode connected transistors (40-43). The diode connected transistors (40-43) substantially eliminate any current flow between bit sense common lines (22, 23, 26, 27) when a certain portion of the column select circuitry has not been selected. Since the blocking transistors (40-43) prevent current flow there is no noise generated to be coupled to one of the control lines (28). This results in a memory array which can operate at higher speeds since better differential signals are established to be sensed by the sense amplifier.