公开(公告)号：US20200144139A1

公开(公告)日：2020-05-07

申请号：US16735117

申请日：2020-01-06

Applicant: Melexis Technologies NV

Inventor： Gunnar MUNDER ,  Heiko GRIMM ,  Thomas FREITAG

IPC: H01L21/66 ,  H01L23/00 ,  G01R31/28 ,  H01L23/64 ,  H01L23/66

Abstract: An edge crack monitoring system for an integrated circuit provided on a die, comprises a conductive trace comprising at least a first conductive path for allowing current in a first direction, and a second adjacent conductive path for allowing current in a second direction opposite to the first direction. Both adjacent conductive paths form at least one loop surrounding a semiconductor device on a die. The arrangement of the trace is adapted to provide compensation of EM interferences. The trace comprises two terminals being connectable to a detection circuit for detecting damages by generating a fault signal upon detection of disruption of the conductive trace due to a damage. The conductive trace comprises high resistance portions with a resistance of at least 1 kΩ, adapted for reducing self-resonance.

公开(公告)号：US20150311834A1

公开(公告)日：2015-10-29

申请号：US14669742

申请日：2015-03-26

Applicant: Melexis Technologies NV ,  DriveXpert GmbH

Inventor： Sandro PURFUERST ,  Heiko GRIMM ,  Viktor PETRI

IPC: H02P6/00

CPC classification number: H02P6/28 ,  H02P25/092

Abstract: A circuit for controlling a multiphase SRM motor, comprising for each winding a low-side and a high-side transistor, and a low-side and a high-side diode for, and at least one current sensor, e.g. a single current sensor, arranged in low-side or high-side implementation for measuring a current through a first and second winding, and a controller adapted for configuring the transistors such that: during a first time slot only the first winding is energized while the second winding is freewheeling via a selected freewheeling path, during a second time slot only the second winding is energized while the first winding is freewheeling via a selected freewheeling path, and measuring the first and second current in said time slots. A method of driving said transistors.

Abstract translation: 一种用于控制多相SRM电动机的电路，包括用于每个绕组低侧和高侧晶体管，以及用于和至少一个电流传感器的低侧和高侧二极管。 布置在低侧或高侧实施中的单电流传感器，用于测量通过第一和第二绕组的电流;以及控制器，适于配置晶体管，使得：在第一时隙期间，仅第一绕组被通电，而 第二绕组经由所选择的续流路径续流，在第二时隙期间，仅第二绕组通电，而第一绕组经由选定的续流路径续流，并测量所述时隙中的第一和第二电流。 一种驱动所述晶体管的方法。

公开(公告)号：US20190286507A1

公开(公告)日：2019-09-19

申请号：US16356459

申请日：2019-03-18

Applicant: Melexis Technologies NV

Inventor： Heiko GRIMM

IPC: G06F11/07

Abstract: A method for detecting a failure in an electronic signal processing system having a signal processing path comprises a configurable functional unit for performing a given function and at least one redundant version of the signal processing path including a corresponding configurable functional unit for performing the given function and configuring a first operating point for the functional unit in the signal processing path for performing the given function and configuring a second operating point for the corresponding functional unit in the redundant version of the signal processing path. The second operating point is different from the first operating point. The method further comprises applying a same input signal to the functional unit and the corresponding functional unit, comparing a first output signal produced by the functional unit with a second output signal produced by the corresponding functional unit, and deriving a failure indication from the comparing.

公开(公告)号：US20180145002A1

公开(公告)日：2018-05-24

申请号：US15819260

申请日：2017-11-21

Applicant: Melexis Technologies NV

Inventor： Gunnar MUNDER ,  Heiko GRIMM ,  Thomas FREITAG

IPC: H01L21/66 ,  H01L23/00 ,  G01R31/28

CPC classification number: H01L22/34 ,  G01R31/2858 ,  G01R31/2896 ,  H01L23/562 ,  H01L23/645 ,  H01L23/66 ,  H01L2223/6677

Abstract: An edge crack monitoring system for an integrated circuit provided on a die, comprises a conductive trace comprising at least a first conductive path for allowing current in a first direction, and a second adjacent conductive path for allowing current in a second direction opposite to the first direction. Both adjacent conductive paths form at least one loop surrounding a semiconductor device on a die. The arrangement of the trace is adapted to provide compensation of EM interferences. The trace comprises two terminals being connectable to a detection circuit for detecting damages by generating a fault signal upon detection of disruption of the conductive trace due to a damage. The conductive trace comprises high resistance portions with a resistance of at least 1 kΩ, adapted for reducing self-resonance.