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公开(公告)号：US10672470B1
公开(公告)日：2020-06-02
申请号：US16209352
申请日：2018-12-04
Applicant: Micron Technology, Inc.
Inventor： Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee
Abstract: An indication that a test resource of a test platform has failed can be received. The test resource can be associated with performing a portion of a test of memory components. A characteristic of the test resource that failed can be determined. Another test resource of the test platform can be identified based on the characteristic of the test resource that failed. The portion of the test of memory components can be performed based on the another test resource of the test platform.
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公开(公告)号：US11257565B2
公开(公告)日：2022-02-22
申请号：US17147072
申请日：2021-01-12
Applicant: Micron Technology, Inc.
Inventor： Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee , Frederick Jensen
Abstract: Filter information including a first temperature level and a second temperature level associated with a test process to be executed on one or more memory components is determined. Information associated with the test process is distributed to a first test component including a first set of memory components and a first temperature control component and a second test component including a second set of memory components and a second temperature control component. First feedback information associated with execution of the test process by the first test component at the first temperature level established by the first temperature control component is received. Second feedback information associated with execution of the test process by the second test component at the second temperature level established by the second temperature control component is received. Based on at least one of the first feedback information or the second feedback information, a failure of the test process executed using at least one of the first temperature level or the second temperature level is determined.
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Patent Agency Ranking
公开(公告)号：US10910081B2
公开(公告)日：2021-02-02
申请号：US16222204
申请日：2018-12-17
Applicant: Micron Technology, Inc.
Inventor： Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee , Frederick Jensen
Abstract: Filter information associated with a test to be performed with one or more memory components is determined. A set of memory components matching the filter information may be reserved for use in the testing. Test execution information defining a set of test processes of the test is determined. A connection with a first test process may be established and used to receive feedback information associated with execution of the test process. Based on the feedback information, a failure of the first test process may be identified.
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公开(公告)号：US20210134385A1
公开(公告)日：2021-05-06
申请号：US17147072
申请日：2021-01-12
Applicant: Micron Technology, Inc.
Inventor： Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee , Frederick Jensen
Abstract: Filter information including a first temperature level and a second temperature level associated with a test process to be executed on one or more memory components is determined. Information associated with the test process is distributed to a first test component including a first set of memory components and a first temperature control component and a second test component including a second set of memory components and a second temperature control component. First feedback information associated with execution of the test process by the first test component at the first temperature level established by the first temperature control component is received. Second feedback information associated with execution of the test process by the second test component at the second temperature level established by the second temperature control component is received. Based on at least one of the first feedback information or the second feedback information, a failure of the test process executed using at least one of the first temperature level or the second temperature level is determined.
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公开(公告)号：US20200176057A1
公开(公告)日：2020-06-04
申请号：US16209352
申请日：2018-12-04
Applicant: Micron Technology, Inc.
Inventor： Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee
Abstract: An indication that a test resource of a test platform has failed can be received. The test resource can be associated with performing a portion of a test of memory components. A characteristic of the test resource that failed can be determined. Another test resource of the test platform can be identified based on the characteristic of the test resource that failed. The portion of the test of memory components can be performed based on the another test resource of the test platform.
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公开(公告)号：US11043269B2
公开(公告)日：2021-06-22
申请号：US16889774
申请日：2020-06-01
Applicant: Micron Technology, Inc.
Inventor： Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee
Abstract: Test resources of a test platform that are performing a test of memory components are determined. An indication that a particular test resource of the test resources of the test platform has failed can be received. The particular test resource is failed while performing a portion of the test of memory components. A remaining portion of the test of memory components can be performed based on the indication that the particular test resource of the test platform has failed.
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公开(公告)号：US20200294587A1
公开(公告)日：2020-09-17
申请号：US16889774
申请日：2020-06-01
Applicant: Micron Technology, Inc.
Inventor： Aswin Thiruvengadam , Sivagnanam Parthasarathy , Daniel Scobee
Abstract: Test resources of a test platform that are performing a test of memory components are determined. An indication that a particular test resource of the test resources of the test platform has failed can be received. The particular test resource is failed while performing a portion of the test of memory components. A remaining portion of the test of memory components can be performed based on the indication that the particular test resource of the test platform has failed.
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