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1.发明专利Device and method of measuring beam diffused and reflected from optically unequal sample 失效测量光束扩散和反射的光学非均匀样品的装置和方法
公开(公告)号：JPS6113136A
公开(公告)日：1986-01-21
申请号：JP12844285
申请日：1985-06-14
Applicant: Miles Lab
Inventor： JIERARUDO EICHI SHIYAFUAA
CPC classification number: G01N21/474 , G01N2021/478 , G01N2201/06146 , G01N2201/0621 , G01N2201/0696
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