公开(公告)号：DE60330067D1

公开(公告)日：2009-12-24

申请号：DE60330067

申请日：2003-09-02

Applicant: NANOMEGAS SPRL

Inventor： SERGEEVICH AVILOV ANATOLY ,  VLADIMIROVICH KULIGIN KIRILL ,  NICOLOPOULOS STAVROS

IPC: H01J37/295 ,  G01N23/20

Abstract: A device and method which enable a transmission electron microscope to measure electron diffraction patterns of a sample very precisely are disclosed. The patterns are suitable for structure determination. The electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample.

公开(公告)号：AT448561T

公开(公告)日：2009-11-15

申请号：AT03750478

申请日：2003-09-02

Applicant: NANOMEGAS SPRL

Inventor： SERGEEVICH AVILOV ANATOLY ,  VLADIMIROVICH KULIGIN KIRILL ,  NICOLOPOULOS STAVROS

IPC: H01J37/295 ,  G01N23/20

Abstract: A device and method which enable a transmission electron microscope to measure electron diffraction patterns of a sample very precisely are disclosed. The patterns are suitable for structure determination. The electron beam is precessed by means of deflector coils (6) in the transmission electron microscope before the sample (4), in combination with a similar precession of the electron diffraction pattern by means of deflector coils (9) situated after the sample. The electron diffraction pattern is scanned by means of deflector coils (9) situated after the sample.