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公开(公告)号:AU2018267721A1
公开(公告)日:2020-01-16
申请号:AU2018267721
申请日:2018-05-16
Applicant: NAT RES COUNCIL CANADA
Inventor: BLOUIN ALAIN , SABSABI MOHAMAD , MONCHALIN JEAN-PIERRE , VANIER FRANCIS
Abstract: A method and a system for characterizing an elemental composition and a molecular composition of a material are provided. Laser-based IR spectroscopy measurements and LIBS measurements are performed at a same analysis spot on the material. The IR spectroscopy measurement data can be used to characterize the molecular composition of the material, whereas the LIBS data can be used to characterize the elemental composition of the material. 2D and 3D profiles of a sample of the material may be obtained based on this data.
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公开(公告)号:CA3063930C
公开(公告)日:2022-07-19
申请号:CA3063930
申请日:2018-05-16
Applicant: NAT RES COUNCIL CANADA
Inventor: BLOUIN ALAIN , SABSABI MOHAMAD , MONCHALIN JEAN-PIERRE , VANIER FRANCIS
Abstract: A method and a system for characterizing an elemental composition and a molecular composition of a material are provided. Laser-based IR spectroscopy measurements and LIBS measurements are performed at a same analysis spot on the material. The IR spectroscopy measurement data can be used to characterize the molecular composition of the material, whereas the LIBS data can be used to characterize the elemental composition of the material. 2D and 3D profiles of a sample of the material may be obtained based on this data.
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公开(公告)号:CA3063930A1
公开(公告)日:2018-11-22
申请号:CA3063930
申请日:2018-05-16
Applicant: NAT RES COUNCIL CANADA
Inventor: BLOUIN ALAIN , SABSABI MOHAMAD , MONCHALIN JEAN-PIERRE , VANIER FRANCIS
Abstract: A method and a system for characterizing an elemental composition and a molecular composition of a material are provided. Laser-based IR spectroscopy measurements and LIBS measurements are performed at a same analysis spot on the material. The IR spectroscopy measurement data can be used to characterize the molecular composition of the material, whereas the LIBS data can be used to characterize the elemental composition of the material. 2D and 3D profiles of a sample of the material may be obtained based on this data.
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