公开(公告)号：US10823676B2

公开(公告)日：2020-11-03

申请号：US16467037

申请日：2017-11-07

Applicant: NUCTECH COMPANY LIMITED

Inventor： Ankai Wang ,  Hongqiu Wang ,  Yumin Yi ,  Haihui Liu ,  Jianhong Zhang

IPC: G01J3/44 ,  G01N21/65

Abstract: The present disclosure relates to a non-contact type security inspection and method, the system including: a laser source for emitting probe light beams which penetrate through a container or a packaging and are irradiated onto an inspected object contained in the container or the packaging; an optical collection device for collecting an exciting light excited by the probe light beams on the inspected object; a spectrum analyzer for analyzing spectral characteristics of the exciting light collected by the optical collection device so as to determine characteristics of the inspected object; and a shielding apparatus for preventing at least part of the exciting light excited by the probe light beams on the container or the packaging from entering an induction area of the optical collection device.

公开(公告)号：US10663393B2

公开(公告)日：2020-05-26

申请号：US15858274

申请日：2017-12-29

Applicant: Nuctech Company Limited

Inventor： Haihui Liu ,  Hongqiu Wang ,  Yumin Yi ,  Jianhong Zhang ,  Ankai Wang

IPC: G01N21/25 ,  G01N21/39 ,  G01N21/65 ,  G01N21/47 ,  G01N21/31

Abstract: An embodiment of the present disclosure provides a spectrum inspecting apparatus. The apparatus includes a laser source; a focusing cylindrical lens configured to converge a light beam onto a sample; a light beam collecting device configured to collect a light beam signal, which is excited by the light beam, from the sample, so as to form a strip-shaped light spot; a slit configured to receive the collected light beam and couple it to downstream of a light path; a collimating device; a dispersing device configured to disperse the collected light beam so as to form a plurality of sub-beams having different wavelengths; an imaging device configured to image the sub-beams on the photon detector array respectively, wherein the light beam emitted from the laser source has a rectangular cross-section, the strip-shaped light spot impinges on the slit and its length is smaller than a length of the slit.

公开(公告)号：US20180188158A1

公开(公告)日：2018-07-05

申请号：US15858274

申请日：2017-12-29

Applicant: Nuctech Company Limited

Inventor： Haihui Liu ,  Hongqiu Wang ,  Yumin Yi ,  Jianhong Zhang ,  Ankai Wang

IPC: G01N21/25 ,  G01N21/39

CPC classification number: G01N21/255 ,  G01N21/39 ,  G01N21/4795 ,  G01N21/65 ,  G01N2021/3129 ,  G01N2021/3137 ,  G01N2021/393 ,  G01N2021/399

Abstract: An embodiment of the present disclosure provides a spectrum inspecting apparatus. The apparatus includes a laser source; a focusing cylindrical lens configured to converge a light beam onto a sample; a light beam collecting device configured to collect a light beam signal, which is excited by the light beam, from the sample, so as to form a strip-shaped light spot; a slit configured to receive the collected light beam and couple it to downstream of a light path; a collimating device; a dispersing device configured to disperse the collected light beam so as to form a plurality of sub-beams having different wavelengths; an imaging device configured to image the sub-beams on the photon detector array respectively, wherein the light beam emitted from the laser source has a rectangular cross-section, the strip-shaped light spot impinges on the slit and its length is smaller than a length of the slit.

公开(公告)号：US20180180551A1

公开(公告)日：2018-06-28

申请号：US15853074

申请日：2017-12-22

Applicant: Nuctech Company Limited

Inventor： Jianhong Zhang ,  Ankai Wang ,  Hongqiu Wang ,  Rui Fan ,  Huacheng Feng

IPC: G01N21/65 ,  G01J5/00 ,  G01N21/01 ,  G05B19/4065 ,  G01J3/44

CPC classification number: G01N21/65 ,  G01J3/44 ,  G01J3/4412 ,  G01J5/0003 ,  G01N21/01 ,  G01N2201/06113 ,  G01N2201/063 ,  G02B27/141 ,  G05B19/4065 ,  G05B2219/49353

Abstract: A Raman spectrum inspection apparatus and a security monitoring method for a Raman spectrum inspection apparatus are provided. The Raman spectrum inspection apparatus includes: a laser device configured to emit an exciting light; an optical device configured to guide the exciting light to an object to be detected and collect a light signal from the object; a spectrometer configured to split the collected light signal to generate a Raman spectrum of the object; and a security detector configured to detect an infrared light emitted from the object.