LARGE-AREA X-RAY GAS DETECTOR
    3.
    发明申请

    公开(公告)号:US20190004185A1

    公开(公告)日:2019-01-03

    申请号:US16026106

    申请日:2018-07-03

    CPC classification number: G01T1/185 G01T3/008 G01V5/0025

    Abstract: A large-area X-ray gas detector includes a housing having an inner cavity and a ray entrance communicated with the inner cavity, a thin entrance window and a signal collection module. The inner cavity is filled with a working gas which is a non-electronegativity gas sensitive to the X-ray. The entrance window is hermetically connected to the ray entrance such that the X-ray enters into the inner cavity. The signal collection module comprises an anode wire electrode layer and a cathode electrode layer arranged parallel with each other in the inner cavity, in which the anode wire electrode layer has an anode wire for accessing to a high voltage, and the cathode electrode layer is grounded. The anode wire electrode layer collects electrons generated by the working gas under an action of the X-ray.

    PULSED SAMPLING-BASED ION MOBILITY SPECTROMETER AND SNIFFER

    公开(公告)号:US20210404988A1

    公开(公告)日:2021-12-30

    申请号:US16626767

    申请日:2019-06-12

    Abstract: There are provided an ion mobility spectrometer and a sniffer. The ion mobility spectrometer includes: an ion migration tube; a sampling gas path having a sampling device configured to temporarily store a sample gas collected by a sampling head in a sampling pipe; a sample introduction gas path having two ends in communication with the gas inlet and outlet of the ion migration tube respectively, and configured to introduce a carrier gas within the ion migration tube into the sampling pipe and to carry a sample gas temporarily stored in the sampling pipe into the ion migration tube; and a valve assembly configured to only allow gas to flow from the sampling device to the sampling pipe in a sampling state, and to only allow gas to flow from the ion migration tube through the sampling pipe back to the ion migration tube in a sample introduction state.

    PREPARATION AND FEED APPARATUS OF STANDARD SAMPLE FOR CALIBRATION OF TRACE-ANALYSIS INSTRUMENT

    公开(公告)号:US20180158659A1

    公开(公告)日:2018-06-07

    申请号:US15786389

    申请日:2017-10-17

    Abstract: Embodiments of the present disclosure relate to a preparation and feed apparatus of a standard sample for calibration of a trace-analysis instrument, and especially to a preparation and feed apparatus of a standard sample for calibration of a gas chromatograph-ion mobility spectrometer. When the trace-analysis instrument is being calibrated by taking advantage of the preparation and feed apparatus according to embodiments of the disclosure, it is unnecessary to use an additional dedicated tool and steps to prepare the sample for testing and to use an organic solvent or a dedicated sample application/dispensing tool, resulting in that the trace-analysis instrument is simple and convenient to carry and use, and the substance for calibration is also convenient to store and exchange; moreover, the trace-analysis instrument is also safe, reliable and environmentally friendly.

    ARTICLE INSPECTION SYSTEM AND METHOD, ELECTRONIC DEVICE, STORAGE MEDIUM

    公开(公告)号:US20210055267A1

    公开(公告)日:2021-02-25

    申请号:US16622553

    申请日:2019-05-17

    Abstract: The present disclosure relates to an article inspection system and method, an electronic device, and a storage medium, and relates to the field of security inspection technology. The system includes: a pre-concentration sampling module configured to concentrate and sample gas molecule of the article under inspection to obtain a sample; a gas chromatography module; an internal circulation gas path module; and an ion migration tube module connected to the internal circulation gas path module and configured to form a fingerprint spectrum of the article under inspection from a spectrum of the pre-separated sample molecules, so as to identify a kind of the article under inspection according to the fingerprint spectrum. The present disclosure improves the efficiency and accuracy of article inspection, and realizes intelligent inspection of articles.

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