公开(公告)号：EP2251666A1

公开(公告)日：2010-11-17

申请号：EP08720369.1

申请日：2008-03-07

Applicant: National Institute of Information and Communication Technology

Inventor： KAWANISHI, Tetsuya ,  NAKAJIMA, Shinya ,  SHINADA, Satoshi

IPC: G01M11/00 ,  G02F1/035

CPC classification number: G02F1/225 ,  G02F2001/212 ,  G02F2201/18 ,  G02F2203/69

Abstract: Problem
An object is to provide a method for evaluating characteristics of individual Mach-Zehnder (MZ) interferometers in an optical modulator which includes a plurality of MZ interferometers.
Means for Solving Problems
The method comprises a step for adjusting a bias voltage of the MZ interferometer, a step for eliminating zero-order components, a step for measuring an output intensity and a step for evaluating characteristics. An optical modulator (1) includes the first MZ interferometer (2) and the second MZ interferometer (3). The first MZ interferometer (2) includes wave-branching section (5). Two arms (6,7), wave coupling section (8) and electrodes which is not shown in figures.

Abstract translation: 问题的一个目的是提供用于在光调制器都包括MZ干涉仪的多元性评价个体马赫 - 曾德尔（MZ）干涉仪的特性提供一种方法。 用于解决问题的方法，包括用于调节MZ干涉仪的偏置电压，为消除零阶分量，用于输出强度的测量步骤和用于评价特性的步骤的步骤的步骤。 干涉仪到光调制器（1）包括第一MZ（2）和所述第二MZ干涉仪（3）。 第一MZ干涉仪（2）包括波分支部（5）。 两个臂（6,7），波耦合部（8）和电极的所有未在附图中示出。

公开(公告)号：EP2261628A1

公开(公告)日：2010-12-15

申请号：EP08720461.6

申请日：2008-03-13

Applicant: National Institute of Information and Communication Technology

Inventor： KAWANISHI, Tetsuya ,  NAKAJIMA, Shinya ,  SHINADA, Satoshi

IPC: G01M11/00

CPC classification number: G01B9/02 ,  G01M11/00 ,  G02F1/2255 ,  G02F2001/212 ,  G02F2201/18 ,  G02F2203/25 ,  G02F2203/69

Abstract: PROBLEMS
To provide a method for evaluating characteristics of MZ interferometers in an optical modulator having a plurality of MZ interferometers.
MEANS FOR SOLVING PROBLEMS
When an optical modulator includes a plurality of MZ interferometers, the 0-degree component contains a signal derived from an MZ interferometer other than the MZ interferometers for evaluating the characteristic. For this, it is impossible to accurately evaluate the characteristic of the MZ interferometers. The present invention does not use the 0-degree component normally having the highest intensity. That is, the characteristic of the MZ interferometers are evaluated by using a side band intensity of the component other than the 0-degree component.

Abstract translation: 问题提供一种用于评估具有多个MZ干涉仪的光调制器中的MZ干涉仪的特性的方法。 解决问题的手段当光调制器包括多个MZ干涉仪时，0度分量包含从用于评估特性的MZ干涉仪以外的MZ干涉仪导出的信号。 为此，不可能准确地评估MZ干涉仪的特性。 本发明不使用通常具有最高强度的0度组分。 也就是说，通过使用除了0度分量之外的分量的边带强度来评估MZ干涉仪的特性。