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公开(公告)号：WO2022170158A1
公开(公告)日：2022-08-11
申请号：PCT/US2022/015404
申请日：2022-02-07
Applicant: PANDUIT CORP.
Inventor： SENESE, John C. , ELLIS, Michael J. , BUGARIS, Rachel M.
IPC: G07C9/00 , G01R19/155
Abstract: A method of providing a user access to an enclosure with an absence of voltage testing device (AVT) includes initiating an absence of voltage test, determining whether the user has appropriate authorization, and providing access to the enclosure.
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