公开(公告)号：CA2732978C

公开(公告)日：2017-06-13

申请号：CA2732978

申请日：2009-04-21

Applicant: PASON SYSTEMS CORP

Inventor： BONYUET DAVID ,  SAPTARI VIDI A

IPC: G01J3/42 ,  G01J3/02 ,  G01J3/12 ,  G01N21/25

Abstract: The invention relates to methods and sys-tems for measuring and/or monitoring the chemical com-position of a sample (e.g., a process stream), and/or de-tecting specific substances or compounds in a sample, using light spectroscopy such as absorption, emission and fluorescence spectroscopy. In certain embodiments, the invention relates to spectrometers with rotating nar-row-band interference optical filter(s) to measure light intensity as a function of wavelength. More specifically, in certain embodiments, the invention relates to a spec-trometer system with a rotatable filter assembly with a position detector rigidly attached thereto, and, in certain embodiments, the further use of various oversampling methods and techniques described herein, made particu-larly useful in conjunction with the rotatable filter assem-bly. In preferred embodiments, the rotatable filter is tilted with respect to the rotation axis, thereby providing sur-prisingly improved measurement stability and signifi-cantly improved control of the wavelength coverage of the filter spectrometer.

公开(公告)号：CA2732978A1

公开(公告)日：2010-02-04

申请号：CA2732978

申请日：2009-04-21

Applicant: PASON SYSTEMS CORP

Inventor： BONYUET DAVID ,  SAPTARI VIDI A

IPC: G01J3/06 ,  G01J3/32 ,  G01N21/25 ,  G01N21/27 ,  G01N21/35

Abstract: The invention relates to methods and systems for measuring and/or monitoring the chemical composition of a sample (e.g., a process stream), and/or detecting specific substances or compounds in a sample, using light spectroscopy such as absorption, emission and fluorescence spectroscopy. In certain embodiments, the invention relates to spectrometers with rotating narrow-band interference optical filter(s) to measure light intensity as a function of wavelength. More specifically, in certain embodiments, the invention relates to a spectrometer system with a rotatable filter assembly with a position detector rigidly attached thereto, and, in certain embodiments, the further use of various oversampling methods and techniques described herein, made particularly useful in conjunction with the rotatable filter assembly. In preferred embodiments, the rotatable filter is tilted with respect to the rotation axis, thereby providing surprisingly improved measurement stability and significantly improved control of the wavelength coverage of the filter spectrometer.