AN APPARATUS AND METHOD FOR PROVIDING SNAPSHOT ACTION THERMAL INFRARED IMAGING WITHIN AUTOMATED PROCESS CONTROL ARTICLE INSPECTION APPLICATIONS
    4.
    发明申请
    AN APPARATUS AND METHOD FOR PROVIDING SNAPSHOT ACTION THERMAL INFRARED IMAGING WITHIN AUTOMATED PROCESS CONTROL ARTICLE INSPECTION APPLICATIONS 审中-公开
    用于在自动化过程控制中提供快速行动热成像的装置和方法文章检查应用

    公开(公告)号:WO2002095382A1

    公开(公告)日:2002-11-28

    申请号:PCT/US2002/016194

    申请日:2002-05-21

    Abstract: This application relates to an apparatus and method for providing snapshot action thermal infrared imaging within automated process control article inspection applications. More specifically, it pertains to the use of snapshot mode lead salt area-array imaging sensors (20) as the imaging front-end in high-speed machine vision inspection systems (12). the relatively low-cost, good measurement sensitivity at temperatures consistent with thermo-electric cooling means, and the ability to be operated in snapshot mode enables lead salt-based image acquisition sensors (20) to be used in a variety of automated process control and article inspection applications.

    Abstract translation: 本申请涉及一种用于在自动化过程控制物品检查应用中提供快照动作热红外成像的装置和方法。 更具体地说,它涉及在高速机器视觉检测系统(12)中使用快照模式铅盐区阵列成像传感器(20)作为成像前端。 在与热电冷却装置一致的温度下相对低成本,良好的测量灵敏度以及以快照模式操作的能力使得基于盐的图像采集传感器(20)可用于各种自动化过程控制和 文章检查申请。

    PATTERNED ILLUMINATION METHOD AND APPARATUS FOR MACHINE VISION SYSTEMS
    7.
    发明申请
    PATTERNED ILLUMINATION METHOD AND APPARATUS FOR MACHINE VISION SYSTEMS 审中-公开
    用于机器视觉系统的图形照明方法和装置

    公开(公告)号:WO2004001285A2

    公开(公告)日:2003-12-31

    申请号:PCT/US2003/019580

    申请日:2003-06-20

    IPC: F21V

    CPC classification number: G01N21/8806

    Abstract: This application relates to an apparatus and method for providing patterned illumination fields for use within process control and article inspection applications. More specifically, it pertains to the use of patterned illuminators to enable visual surface inspection of polished objects such as ball bearings. The use of patterned illuminators properly disposed in relation to a polished part under inspection allows small surface imperfections such as scratches and pits to become visible against the normal surface background. The use of carefully engineered illuminators facilitates advantageous defect-site scattering from generally dark field sources. The patterned nature of the illuminators defined by this invention allows the complete surface of three-dimensional parts to be effectively highlighted using dark field illumination fields.

    Abstract translation: 本申请涉及一种用于提供在过程控制和物品检查应用中使用的图案化照明场的装置和方法。 更具体地说,它涉及图案化照明器的使用以使得诸如球轴承之类的抛光物体的视觉表面检查。 相对于被检查的抛光部分适当地设置的图案照明器的使用允许诸如划痕和凹坑的小表面缺陷对于正常表面背景变得可见。 使用精心设计的照明器有助于从一般暗场光源获得有利的缺陷点散射。 由本发明限定的照明器的图案性质允许使用暗场照明场有效地突出显示三维部分的完整表面。

    APPARATUS AND METHOD OF PROVIDING SPATIALLY-SELECTIVE ON-­LINE MASS OR VOLUME MEASUREMENTS OF MANUFACTURED ARTICLES
    8.
    发明申请
    APPARATUS AND METHOD OF PROVIDING SPATIALLY-SELECTIVE ON-­LINE MASS OR VOLUME MEASUREMENTS OF MANUFACTURED ARTICLES 审中-公开
    提供空间选择性的在线质量或体积测量的制造商品的装置和方法

    公开(公告)号:WO2003069283A2

    公开(公告)日:2003-08-21

    申请号:PCT/US2003/003773

    申请日:2003-02-07

    IPC: G01F

    CPC classification number: G01G9/00 G01F17/00 G01G15/00 Y10S177/06

    Abstract: This invention relates to a method and apparatus for mass and/or volume measurements of manufactured articles. More particularly, this invention relates to a method and apparatus for mass and/or volume measurements that can be performed on-line in a part manufacturing process. On-line measurement of the mass or volume of material contained in a specific region of interest of the manufactured items is performed 100% on-line. Real-time process control information is based on real-time measurement of the mass or volume of material contained in a specific region of interest of a manufactured item. Automated quality control inspection for manufactured articles is based on real­time measurement of the mass or volume of material contained in a specific region of interest of manufactured items. A manufacturing closed-loop process is directly corrected to keep it within control limits based on real-time measurement of the mass or volume of material contained in a specific region of interest of manufactured items soon after these items are manufactured.

    Abstract translation: 本发明涉及制造物品的质量和/或体积测量的方法和装置。 更具体地说,本发明涉及可以在零件制造过程中在线执行的质量和/或体积测量的方法和装置。 在制品的特定感兴趣区域中包含的材料的质量或体积的在线测量在线100%进行。 实时过程控制信息基于对制成物品的特定感兴趣区域中包含的材料的质量或体积的实时测量。 制造品的自动质量控制检查是基于实际测量包含在制造物品的特定感兴趣区域中的材料的质量或体积。 直接校正制造闭环过程,以便在制造这些物品之后不久,基于实时测量包含在制造物品的特定感兴趣区域中的材料的质量或体积,将其保持在控制限度内。

    HIGH-DENSITY SOLID-STATE LIGHTING ARRAY FOR MACHINE VISION APPLICATIONS
    9.
    发明申请
    HIGH-DENSITY SOLID-STATE LIGHTING ARRAY FOR MACHINE VISION APPLICATIONS 审中-公开
    高密度固态照明阵列机器视觉应用

    公开(公告)号:WO1997037385A1

    公开(公告)日:1997-10-09

    申请号:PCT/US1997001114

    申请日:1997-01-24

    Abstract: A solid-state lighting unit for automated visual inspection includes a high-density array of light emitting diodes (12). The packaging density of said diode array being limited only by the physical size of the light emitting diode chips and the ability to perform die and wire bond operations on the bare chips. Each diode is disposed on an electrically insulated, thermally conductive base unit (10). The base unit is, in turn, in a thermally conductive path with a heat dissipator (30). The provisons made to ensure a thermally conductive path from the individual light emitting diode chips to the heat dissipator combined with the high chip packing densities work together to create a solid-state lighting array capable of producing extremely high illumination fields when operated in either pulsed or continuous current mode.

    Abstract translation: 用于自动目视检查的固态照明单元包括高密度阵列的发光二极管(12)。 所述二极管阵列的封装密度仅受限于发光二极管芯片的物理尺寸以及在裸芯片上执行裸片和引线键合操作的能力。 每个二极管设置在电绝缘的导热基底单元(10)上。 基座单元又在具有散热器(30)的导热路径中。 确保从单个发光二极管芯片到散热器的热传导路径与高芯片封装密度相结合的条件一起工作,以产生固态照明阵列,其能够在以脉冲或 连续电流模式。

    APPARATUS AND METHOD FOR INSPECTING MULTI-LAYER PLASTIC CONTAINERS
    10.
    发明公开
    APPARATUS AND METHOD FOR INSPECTING MULTI-LAYER PLASTIC CONTAINERS 审中-公开
    用于检查多层塑料容器的装置和方法

    公开(公告)号:EP1181526A1

    公开(公告)日:2002-02-27

    申请号:EP00930125.0

    申请日:2000-04-21

    Abstract: This invention relates to an apparatus and method for inspecting multi-layer plastic containers (10). More particularly, the invention relates to such an apparatus and method whereby optical energy absorbing compounds are added to the materials comprising the layer(s) of the container (10) to facilitate inspection thereof. Apparatus comprises a sensor unit (40), an illumination unit (30) for illuminating a portion of electromagnetic spectrum at a near IR wavelength to an inspection zone (20) which is located between the sensor unit (40) and the illumination unit (30). A processing unit (50) which receives an output of the sensor unit (40) and determines the attributes of the multi-layer plastic containers (10).

    Abstract translation: 本发明涉及检查多层塑料容器(10)的设备和方法。 更具体地说,本发明涉及这样一种装置和方法,由此将光能吸收化合物添加到包含容器(10)的层的材料中以便于对其进行检查。 设备包括传感器单元(40),照明单元(30),用于照射位于传感器单元(40)和照明单元(30)之间的检测区域(20)的近IR波长的电磁光谱的一部分 )。 处理单元(50),其接收传感器单元(40)的输出并确定多层塑料容器(10)的属性。

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