Abstract:
An inspection system (10) includes a camera (30) coupled to a processor (40) to generate a number of image signals corresponding to a multicolor pattern of an item in motion on a conveyor (20). The processor (40) models the multicolor pattern by deriving a number of test values from a segmented image representation of the item provided by the camera (30). Each test value is representative of a corresponding one of the segmented regions of the pattern and is determined as a function of region size independent of orientation of the multicolor pattern. The test values are compared to reference data by the processor (40) to inspect the item.