公开(公告)号：US20100141944A1

公开(公告)日：2010-06-10

申请号：US12524420

申请日：2008-01-31

Applicant: Peter Zipfl

Inventor： Peter Zipfl

IPC: G01J3/28 ,  G01N21/27 ,  G01N21/31

CPC classification number: G01N21/274 ,  G01J3/10 ,  G01N21/31 ,  G01N21/3563 ,  G01N21/359 ,  G01N2201/0624

Abstract: An apparatus for the spectral diagnosis of substances and/or surfaces includes a radiation source which can be variably adjusted over a predetermined spectral range and whose emitted radiation is focused onto a sample to be examined, wherein a first optical sensor unit detects a radiation component, which is influenced by the sample to be examined, as a useful signal and forwards it to an evaluation and control unit, and to an associated method. The radiation source comprises a light-emitting diode with a predetermined emission wavelength which can be varied between a first emission wavelength and a second emission wavelength by a dynamic change in temperature of the light-emitting diode within the predetermined spectral range, wherein a second optical sensor unit detects a component of the emitted radiation as a reference signal and forwards it to the evaluation and control unit for error compensation purposes.

Abstract translation: 用于物质和/或表面的光谱诊断的装置包括可以在预定光谱范围内可变地调节并且其发射的辐射聚焦到待检测样品上的辐射源，其中第一光学传感器单元检测辐射分量， 其受到被检查样本的影响，作为有用的信号并将其转发给评估和控制单元以及相关联的方法。 辐射源包括具有预定发射波长的发光二极管，其可以在预定光谱范围内的发光二极管的温度的动态变化在第一发射波长和第二发射波长之间变化，其中第二光学 传感器单元将发射的辐射的分量作为参考信号进行检测，并将其转发给评估和控制单元进行误差补偿。