QUANTITATIVE CHARACTERIZATION OF NONLINEARITY AND MEMORY EFFECT IN NONLINEAR CIRCUITS
    1.
    发明申请
    QUANTITATIVE CHARACTERIZATION OF NONLINEARITY AND MEMORY EFFECT IN NONLINEAR CIRCUITS 审中-公开
    非线性电路中非线性和记忆效应的量化特征

    公开(公告)号:WO2015089090A1

    公开(公告)日:2015-06-18

    申请号:PCT/US2014/069371

    申请日:2014-12-09

    Abstract: An input signal is transmitted to a component. A distortion associated with the component is determined based, at least in part, on an output signal generated by the component in response to the input signal. A distortion error measurement associated with the component is determined based, at least in part, on the distortion and the output signal generated by the component. A memory effect and the associated nonlinearity within the component are quantified based, at least in part, on the distortion error measurement.

    Abstract translation: 输入信号被发送到组件。 至少部分地基于由该组件响应输入信号产生的输出信号来确定与该组件相关联的失真。 至少部分地基于由该部件产生的失真和输出信号确定与该部件相关联的失真误差测量。 至少部分地基于失真误差测量量化部件内的记忆效应和相关联的非线性。

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