Optimization of the source firing pattern for X-ray scanning systems

    公开(公告)号:AU2012382065B2

    公开(公告)日:2016-07-07

    申请号:AU2012382065

    申请日:2012-06-05

    Abstract: The present application discloses a computed tomography system having non-rotating X-ray sources that are programmed to optimize the source firing pattern. In one embodiment, the CT system is a fast cone-beam CT scanner which uses a fixed ring of multiple sources and fixed rings of detectors in an offset geometry. It should be appreciated that the source firing pattern is effectuated by a controller, which implements methods to determine a source firing pattern that are adapted to geometries where the X-ray sources and detector geometry are offset.

    WALK-THROUGH METAL DETECTION SYSTEM

    公开(公告)号:CA2872895C

    公开(公告)日:2018-08-07

    申请号:CA2872895

    申请日:2012-06-28

    Abstract: The present application is a detection system for locating and characterizing an object placed in a detection area in a three dimensional space. The detection system includes a plurality of magnetic field generators and magnetic field detectors arranged on opposite sides of the detection area and a control system for enabling generation of a magnetic field in the detection area by the magnetic field generators and for measuring of the magnetic field modified by the object at each of the magnetic field detectors. The detection system also includes a processor for processing the measured magnetic field to obtain a data set characterizing the object and a location of the object. The processor applies a reconstruction process on a predefined number of measurements of the modified magnetic field.

    OPTIMIZACION DEL PATRON DE DISPARO DE LA FUENTE PARA SISTEMAS DE ESCANEO DE RAYOS X.

    公开(公告)号:MX2014014767A

    公开(公告)日:2015-04-13

    申请号:MX2014014767

    申请日:2012-06-05

    Abstract: La presente solicitud divulga un sistema de tomografía computarizado que tiene fuentes de rayos X no giratorias que son programadas para optimizar el patrón de disparo de la fuente. En una modalidad, el sistema de CT es un escáner de CT de haz de cono rápido que utiliza un anillo fijo de múltiples fuentes y anillos fijos de detectores en una geometría desfasada. Se debe apreciar que el patrón de disparo de la fuente se efectúa por medio de un controlador, el cual implementa métodos para determinar un patrón de disparo de la fuente que se adapta a las geometrías donde la geometría de las fuentes de rayos X y el detector están desfasadas.

    OPTIMIZATION OF THE SOURCE FIRING PATTERN FOR X RAY SCANNING SYSTEMS

    公开(公告)号:IN10327DEN2014A

    公开(公告)日:2015-08-07

    申请号:IN10327DEN2014

    申请日:2014-12-04

    Abstract: The present application discloses a computed tomography system having non rotating X ray sources that are programmed to optimize the source firing pattern. In one embodiment the CT system is a fast cone beam CT scanner which uses a fixed ring of multiple sources and fixed rings of detectors in an offset geometry. It should be appreciated that the source firing pattern is effectuated by a controller which implements methods to determine a source firing pattern that are adapted to geometries where the X ray sources and detector geometry are offset.

    Optimization of the source firing pattern for X-ray scanning systems

    公开(公告)号:AU2012382065A1

    公开(公告)日:2015-01-15

    申请号:AU2012382065

    申请日:2012-06-05

    Abstract: The present application discloses a computed tomography system having non-rotating X-ray sources that are programmed to optimize the source firing pattern. In one embodiment, the CT system is a fast cone-beam CT scanner which uses a fixed ring of multiple sources and fixed rings of detectors in an offset geometry. It should be appreciated that the source firing pattern is effectuated by a controller, which implements methods to determine a source firing pattern that are adapted to geometries where the X-ray sources and detector geometry are offset.

    WALK-THROUGH METAL DETECTION SYSTEM

    公开(公告)号:CA2872895A1

    公开(公告)日:2013-01-10

    申请号:CA2872895

    申请日:2012-06-28

    Abstract: The present application is a detection system for locating and characterizing an object placed in a detection area in a three dimensional space. The detection system includes a plurality of magnetic field generators and magnetic field detectors arranged on opposite sides of the detection area and a control system for enabling generation of a magnetic field in the detection area by the magnetic field generators and for measuring of the magnetic field modified by the object at each of the magnetic field detectors. The detection system also includes a processor for processing the measured magnetic field to obtain a data set characterizing the object and a location of the object. The processor applies a reconstruction process on a predefined number of measurements of the modified magnetic field.

    WALK-THROUGH METAL DETECTION SYSTEM
    10.
    发明公开
    WALK-THROUGH METAL DETECTION SYSTEM 审中-公开
    步入式金属检测系统

    公开(公告)号:EP2764354A4

    公开(公告)日:2015-12-30

    申请号:EP12806989

    申请日:2012-06-28

    CPC classification number: G01V3/104 G01V3/105 G01V3/12 G08B21/22

    Abstract: The present application is a detection system for locating and characterizing an object placed in a detection area in a three dimensional space. The detection system includes a plurality of magnetic field generators and magnetic field detectors arranged on opposite sides of the detection area and a control system for enabling generation of a magnetic field in the detection area by the magnetic field generators and for measuring of the magnetic field modified by the object at each of the magnetic field detectors. The detection system also includes a processor for processing the measured magnetic field to obtain a data set characterizing the object and a location of the object. The processor applies a reconstruction process on a predefined number of measurements of the modified magnetic field.

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