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    3.
    发明专利
    未知

    公开(公告)号：DE68919078T2

    公开(公告)日：1995-03-30

    申请号：DE68919078

    申请日：1989-12-22

    Applicant: RENISHAW PLC

    Inventor： BATCHELDER DAVID ,  CHENG CHUNWEI ,  SMITH BRIAN

    IPC: G01N21/65 ,  G01J3/12 ,  G01J3/44 ,  G02B21/00

    Abstract: PCT No. PCT/GB89/01532 Sec. 371 Date Aug. 6, 1990 Sec. 102(e) Date Aug. 6, 1990 PCT Filed Dec. 22, 1989 PCT Pub. No. WO90/07108 PCT Pub. Date Jun. 28, 1990.A sample (14) is illuminated by light from a laser source (16), which is reflected to it by a dichroic filter (18) and passed through a microscope objective (20). The microscope objective (20) focusses a two dimensional image of the illuminated area onto a detector (22). On the way to the detector (22), the light passes through an interference filter (26), which selects a desired line from the Raman spectrum scattered by the sample (14). The filter (26) can be tuned to any desired Raman line by rotating it through various angles of incidence ( THETA ), about an axis (28) perpendicular to the optical axis.

    5.
    发明专利
    未知

    公开(公告)号：DE68919078D1

    公开(公告)日：1994-12-01

    申请号：DE68919078

    申请日：1989-12-22

    Applicant: RENISHAW PLC

    Inventor： BATCHELDER DAVID ,  CHENG CHUNWEI ,  SMITH BRIAN

    IPC: G01N21/65 ,  G01J3/12 ,  G01J3/44 ,  G02B21/00

    Abstract: PCT No. PCT/GB89/01532 Sec. 371 Date Aug. 6, 1990 Sec. 102(e) Date Aug. 6, 1990 PCT Filed Dec. 22, 1989 PCT Pub. No. WO90/07108 PCT Pub. Date Jun. 28, 1990.A sample (14) is illuminated by light from a laser source (16), which is reflected to it by a dichroic filter (18) and passed through a microscope objective (20). The microscope objective (20) focusses a two dimensional image of the illuminated area onto a detector (22). On the way to the detector (22), the light passes through an interference filter (26), which selects a desired line from the Raman spectrum scattered by the sample (14). The filter (26) can be tuned to any desired Raman line by rotating it through various angles of incidence ( THETA ), about an axis (28) perpendicular to the optical axis.

    Raman Microscope.
    7.
    发明专利
    Raman Microscope. 未知

    公开(公告)号：ZA964715B

    公开(公告)日：1997-12-08

    申请号：ZA964715

    申请日：1996-06-06

    Applicant: RENISHAW PLC

    Inventor： BALDWIN KURT JUSTIN ,  CHENG CHUNWEI ,  BATCHELDER IAN PAUL HAYWARD DA

    IPC: G01J3/44 ,  G01N21/65 ,  G01J

    Abstract: In a Raman microscope, Raman scattered light from an illuminated area on a sample 10 is collected by an objective 12 and imaged by a lens 18 onto a detector in an image plane 20. A filter 16 selects only light of a desired Raman wavenumber shift. Since the tuning of this filter is sensitive to the angle of incidence, it is placed after the lens 18 instead of before it, and the distance from the objective 12 to the lens 18 is made substantially equal to the focal length of the lens 18. This ensures that chief rays 14A',14B' from different points on the sample 10 pass through the filter 16 at the same angle of incidence. The wavenumber selected by the filter is therefore the same for light from all points on the sample, which it would not be if the filter were placed before the lens 18.

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