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1.发明公开METHOD AND SYSTEM FOR DETECTING DEFECTS OF TRANSPARENT SUBSTRATE 审中-公开VERFAHREN UND SYSTEM ZUR ERKENNUNG VON DEFEKTEN EINES TRANSPARENTEN SUBSTRATS
公开(公告)号：EP2430431A4
公开(公告)日：2017-08-02
申请号：EP10774567
申请日：2010-05-14
Applicant: SAINT-GOBAIN GLASS FRANCE
Inventor： ZHENG YUAN , SCHWEITZER JEAN-PHILIPPE , LIN XIAOFENG , CHEN DAZHI
IPC: G01N21/896 , G01N21/88 , G01N21/958 , G06K9/00 , H04N7/18
CPC classification number: G01N21/896 , G01N21/88 , G01N2021/8825 , G06K9/00 , H04N7/18
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