Automated machine learning test system

    公开(公告)号:US11886329B2

    公开(公告)日:2024-01-30

    申请号:US17840745

    申请日:2022-06-15

    CPC classification number: G06F11/3684 G06F11/3688

    Abstract: A computing device selects new test configurations for testing software. (A) First test configurations are generated using a random seed value. (B) Software under test is executed with the first test configurations to generate a test result for each. (C) Second test configurations are generated from the first test configurations and the test results generated for each. (D) The software under test is executed with the second test configurations to generate the test result for each. (E) When a restart is triggered based on a distance metric value computed between the second test configurations, a next random seed value is selected as the random seed value and (A) through (E) are repeated. (F) When the restart is not triggered, (C) through (F) are repeated until a stop criterion is satisfied. (G) When the stop criterion is satisfied, the test result is output for each test configuration.

    AUTOMATED MACHINE LEARNING TEST SYSTEM

    公开(公告)号:US20220308989A1

    公开(公告)日:2022-09-29

    申请号:US17840745

    申请日:2022-06-15

    Abstract: A computing device selects new test configurations for testing software. (A) First test configurations are generated using a random seed value. (B) Software under test is executed with the first test configurations to generate a test result for each. (C) Second test configurations are generated from the first test configurations and the test results generated for each. (D) The software under test is executed with the second test configurations to generate the test result for each. (E) When a restart is triggered based on a distance metric value computed between the second test configurations, a next random seed value is selected as the random seed value and (A) through (E) are repeated. (F) When the restart is not triggered, (C) through (F) are repeated until a stop criterion is satisfied. (G) When the stop criterion is satisfied, the test result is output for each test configuration.

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