公开(公告)号：US11860212B1

公开(公告)日：2024-01-02

申请号：US18214038

申请日：2023-06-26

Applicant: SAS Institute Inc.

Inventor： Thomas Dale Anderson ,  Priyadarshini Sharma ,  Mark Joseph Konya ,  Yuwei Liao

IPC: G01R31/08 ,  G06Q30/01 ,  H02J13/00

CPC classification number: G01R31/086 ,  G06Q30/01 ,  H02J13/00002

Abstract: A computer monitors a status of grid devices using sensor measurements. Sensor data is clustered using a predefined grouping distance value to define one or more sensor event clusters. A plurality of monitored devices is clustered using a predefined clustering distance value to define one or more asset clusters. A location is associated with each monitored device of the plurality of monitored devices. A distance is computed between each sensor event cluster and each asset cluster. When the computed distance is less than or equal to a predefined asset/sensor distance value for a sensor event cluster and an asset cluster, an asset identifier of the asset cluster associated with the computed distance is added to an asset event list. For each asset cluster included in the asset event list, an asset location of an asset is shown on a map in a graphical user interface presented in a display.

公开(公告)号：US11322976B1

公开(公告)日：2022-05-03

申请号：US17501218

申请日：2021-10-14

Applicant: SAS Institute Inc.

Inventor： Thomas Dale Anderson ,  Priyadarshini Sharma ,  Mark Joseph Konya ,  James M. Caton

IPC: H02J13/00 ,  G06N3/04 ,  G06K9/62

Abstract: Operational events associated with a target physical device can be detected for mitigation by implementing some aspects described herein. For example, a system can apply a sliding window to received sensor measurements at successive time intervals to generate a set of data windows. The system can determine a set of eigenvectors associated with the set of data windows by performing principal component analysis on a set of data points in the set of data windows. The system can determine a set of angle changes between pairs of eigenvectors. The system can generate a measurement profile by executing an integral transform on the set of angle changes. One or more trained machine-learning models are configured to detect an operational event associated with the target physical device based on the measurement profile and generate an output indicating the operational event.