Abstract:
The present invention relates to an electronic power on reset circuit (1) of the type comprising a comparator (2) having at least two inputs and one output (A) for receiving a first reference signal from a generator block (11) and a second signal proportional to a supply voltage (Vdd) from a divider block (12) and for producing at output an initialization signal (INTPOR). Advantageously the output (A) is connected to a third turn off enablement input (10) of the comparator (2) through the series of an inverter pair (I1,I2). The generator block (11) and the divider block (12) also comprise respective turn off enablement inputs (15,13) connected downstream of the inverter pair (I1,I2).
Abstract:
A low-noise output stage (1) for electronic circuits (2) integrated on a semiconductor substrate (3) is disclosed which comprises a complementary CMOS transistor pair (Pu,Nu) of the P-channel pull-up and the N-channel pull-down type, respectively, connected across a first terminal (A) of the circuit receiving a supply voltage (Vdd), and a second terminal (D) of the circuit being held at a second reference potential (GND). The transistors are connected together to form an output terminal (U) for connection to an external load (Cload), and the pull-down transistor is formed in a three-well structure to prevent propagation of a discharge current (Id) from the external load through the substrate (3).
Abstract:
A negative charge pump circuit comprises a plurality of charge pump stages (S1'-S4') connected in series to each other. Each stage has a stage input terminal (SI) and a stage output terminal (SO). A first stage (S1') has the stage input terminal (SI) connected to a reference voltage, a final stage (S4') has the stage output terminal (SO) operatively connected to an output terminal (O) of the charge pump at which a negative voltage is developed; intermediate stages (S2' ,S3') have the respective stage input terminal (SI) connected to the stage output terminal (SO) of a preceding stage and the respective stage output terminal connected to the stage input terminal of a following stage. Each stage (S1'-S4') comprises a first N-channel MOSFET (M1') with a first electrode connected to the stage input terminal (SI) and a second electrode connected to the stage output terminal (SO), a second N-channel MOSFET (M2') with a first electrode connected to the stage output terminal (SO) and a second electrode connected to a gate electrode of the first N-channel MOSFET (M1'), a boost capacitor (CP) with one terminal connected to the gate electrode of the first N-channel MOSFET and a second terminal driven by a respective first digital signal (A',C') switching between the reference voltage and a positive voltage supply (VDD), and a second capacitor (CL) with one terminal connected to the charge pump stage output terminal (SO) and a second terminal connected to a respective second digital signal (B',D') switching between the reference voltage and the voltage supply (VDD). A gate electrode of the second N-channel MOSFET (M2') is connected, in the first stage (S1'), to a third digital signal (D') switching between the reference voltage and the voltage supply, while in the remaining stage the gate electrode of the second N-channel MOSFET is connected to the stage input terminal (SI).
Abstract:
A charge pump comprises a plurality of stages (S1,S2,S3',S4') connected in series between a reference potential and an output terminal (O) of the charge pump. The plurality of stages comprises a first group of stages (S1,S2), proximate to the reference potential, and a second group of stages (S3',S4') proximate to the output terminal of the charge pump. Each stage of the first group comprising a pass-transistor (M1) with first and second terminals respectively connected to an input and an output of the stage, and a first capacitor (CL) with a first plate connected to the output of the stage and a second plate driven by a digital signal (B,D) switching between the reference voltage and a positive voltage (VDD); each stage of the second group comprising a junction diode (D) having a first electrode connected to an input of the stage and a second electrode connected to an output of the stage, and a second capacitor (CL') having a first plate connected to the output of the stage and a second plate driven by a digital signal (B',D') switching between the reference voltage and the voltage supply.
Abstract:
The present invention concerns a redundant UPROM cell (1) incorporating at least one memory element (P0) of the EPROM or flash type having a control terminal (CG) and a conduction terminal (X) to be biased, a register (2) with inverters connected to the memory element and MOS transistors (M1,M3) connecting said memory element (P0) with a reference low voltage power supply (Vdd). There is provided a precharge network (5) for the conduction terminal (X) of the flash cell and said network (5) incorporates a complementary pair of transistors (M4,M5). The second transistor (M5) of said pair (M4,M5) is a natural N-channel MOS type. With the UPROM cell (1) is associated a circuit portion (10) for generating at output (U) a live signal (UPCH) to be applied to the control terminal of the second transistor (M5) with the portion (10) comprising a timing section (7) and a generation section (8) for said second live signal (UPCH).
Abstract:
The invention relates to a method of recovering faulty non-volatile memories. This method can be applied to an electrically programmable semiconductor non-volatile memory device being set up as a multi-sectors memory matrix and including selection circuitry for selecting words or individual bytes of the memory. According to this method, the memory matrix is addressed by byte, rather than by memory word, by acting said selection circuitry, whenever the device fails an operation test. The use of a Hamming code of error correction to remedy malfunctions due to manufacture allows the method to be applied to those devices which fail their test and would otherwise be treated as rejects.
Abstract:
The present invention relates to a memory device of the type comprising:
at least one first (M1) and one second (M2) memory cell array for storage respectively of a first plurality of user data and a second plurality of error identification and correction data, first (D1) and second (D2) decoding means connected respectively to the first (M1) and second (M2) memory cell array for selection and reading respectively of the first and second pluralities of data, error identification means (L1) coupled to said first (D1) and second (D2) decoder means, and error correction means (C1,C2,EN) operationally connected to said first (D1) and second (D2) decoder means and to said error identification means (L1), and characterized in that it comprises at least one logical control unit (L2) operationally connected to the second decoder means (D2), to error identification means (L1) and to the error correction means (C1,C2,EN) to enable said second decoder means (D2) and said error correction means (C1,C2,EN) if an error is detected by the error identification means (L1).