Abstract:
The switch in accordance with the present invention comprises two MOS transistors (M1,M2) whose main conduction paths are connected respectively upstream and downstream of the terminals (T1,T2) of the network (C2) of which it is desired to control electrically the electrical connection. In this manner current can flow in the network (C2) only if both the transistors (M1,M2) are conducting.
Abstract:
The switch of this invention has two conduction terminals (TA,TB) and basically consists of the parallel coupling, across the two conduction terminals (TA,TB), of a first N-channel MOS transistor (M1L) and second P-channel MOS transistor (M1R). The first MOS transistor will be conducting when the signal applied to the conduction terminals has a first polarity, and the second MOS transistor will be conducting when the signal applied to the conduction terminals has a second polarity. Advantageously, if two unidirectional conduction circuit elements (D1L,D1R) are respectively connected in series with the main conduction paths of the two MOS transistors (M1L,M1R), the drain/body junctions (DI1L,DI1R) of the latter will never be conducting regardless of the way the switch is connected.
Abstract:
A voltage, replica of the difference between two dissimilar base-emitter voltages in the form of an intrinsic input offset voltage of a differential input pair of transistors of a noninverting, buffer-configured operational amplifier, is summed with a pre-established fraction of a base-emitter voltage, to produce a voltage reference without thermal drift of a level that can be as low as few 10mV. The intrinsic input offset voltage is controlled by a local feedback loop acting on the bias current that is forced through the input pair of transistors that may be realized with a certain area ratio. The relatively simple circuit is useful in battery operated, low supply voltage, systems.
Abstract:
The method described is applied to an integrated circuit formed on a substrate (10) of p-type material having at least one region (11) of n-type material with junction insulation, first electrical contact means (20,21) on the frontal surface of the substrate, second electrical contact means (14,14') on the n-type region (11) and third electrical contact means (8) on the back of the substrate connected to a reference (ground) terminal of the integrated circuit. To avoid current in the substrate due to the conduction of parasitic bipolar transistors in certain operating conditions of the integrated circuit, the method provides for monitoring the potential of the second contact means (14,14') to detect if this potential departs from the (ground) potential of the reference terminal by an amount greater than a predetermined threshold value. If this occurs the first contact means (20,21) are taken to the potential of the second contact means (14,14'), otherwise they are held at the (ground)potential of the reference terminal. A device and an integrated circuit which utilise the method are also described.