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公开(公告)号：DE3639350A1
公开(公告)日：1987-05-21
申请号：DE3639350
申请日：1986-11-18
Applicant: SHIMADZU CORP
Inventor： NAKAMURA KENJI , TOKUHARA YASUTAKA
Abstract: Method and apparatus for measuring light by frequency-modulating a light signal from a sample being measured and demodulating the modulated signal in synchronism with the modulating operation, wherein there is provided a delay circuit which produces a series of pulses for synchronous rectification of the modulated signal in response to and with a predetermined time delay after the modulating operation, so that before measurement of a specific sample the delay time is changed so as to determine the phase of the synchronous rectification pulses most suitable for measurement of the specific sample.
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公开(公告)号：DE3639350C2
公开(公告)日：1995-06-01
申请号：DE3639350
申请日：1986-11-18
Applicant: SHIMADZU CORP
Inventor： NAKAMURA KENJI , TOKUHARA YASUTAKA
Abstract: Method and apparatus for measuring light by frequency-modulating a light signal from a sample being measured and demodulating the modulated signal in synchronism with the modulating operation, wherein there is provided a delay circuit which produces a series of pulses for synchronous rectification of the modulated signal in response to and with a predetermined time delay after the modulating operation, so that before measurement of a specific sample the delay time is changed so as to determine the phase of the synchronous rectification pulses most suitable for measurement of the specific sample.
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公开(公告)号：JPS6073423A
公开(公告)日：1985-04-25
申请号：JP18413583
申请日：1983-09-30
Applicant: SHIMADZU CORP
Inventor： TOKUHARA YASUTAKA , NAKAMURA KENJI
Abstract: PURPOSE:To eliminate a trouble such as setting of a diffraction grating exchanging wavelength with avoiding a peak position of a spectrum as usual by constituting the titled photometer so that a step difference in a spectrum record at its wavelength position is not caused even if the diffraction grating is exchanged. CONSTITUTION:A part of a long wavelength end side of a wavelength range in which a grating G1 is usable and a part of a short wavelength end side of a wavelength range in which a grating G2 is usable are piled, and a wavelength for exchanging the diffraction gratings can be set arbitrarily in the piled wavelength range. Two gratings G1, G2 are attached back to back on an exchanging base 1, and the gratings G1, G2 are exchanged by rotating the base 1 by 180 deg. around a point 0 as a center. The base 1 is attached on a wave number feeding base 3, the base 3 is rotatable around a shaft X as a center vertical to a paper surface of the figure and passing a center of the diffraction grating (G1 in the figure) in a using position, and is rotated around said shaft as a center by a wave number feeding base driving mechanism 4. A CPU controls the mechanism 4 and a diffraction grating exchanging motor 2.
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公开(公告)号：JPS60135829A
公开(公告)日：1985-07-19
申请号：JP24832983
申请日：1983-12-26
Applicant: SHIMADZU CORP
Inventor： TOKUHARA YASUTAKA , NAKAMURA KENJI
Abstract: PURPOSE:To enable the automatic selection of an optimum slit program, by shifting a slit program in linkage to the setting of a wave scanning speed so that a relatively wide slit width can be realized. CONSTITUTION:In a double-beam spectrophotometer comprising a light source L, a collation cell Cr, a sample sell Cs, a beam mixer 5, spectroscope 6, a detector 10, etc., a control computer 8 computes the ratio between an integrated output Is of a sample signal and an integrated output Ir of a collation signal when the integrated output Ir of the collation signal exceeds a prescribed level. This ratio indicates the transmittance of a sample representing the integrated section thereof. When a collated light signal obtained by using a reference slit program is denoted by Pr, a wave scanning speed by V and a slit opening rate selected at said scanning speed by B, on the occasion, an optimum slit program is selected automatically according to the scanning speed by varying the opening rate B in proportion to a square root of the wave scanning speed V by means of a keyboard 16.
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公开(公告)号：JPS60135730A
公开(公告)日：1985-07-19
申请号：JP24680883
申请日：1983-12-23
Applicant: SHIMADZU CORP
Inventor： NAKAMURA KENJI , TOKUHARA YASUTAKA
IPC: G01J3/42
Abstract: PURPOSE:To remove influence of absorption, etc. due to atmospheric components and to make a high speed wavelength scanning possible by integrating respective optical signals of a control and sample to obtain the ratio, and obtaining the ratio, of both signals from the obtained ratio at front and rear ends of the integral interval in the midway thereof by interpolating method. CONSTITUTION:Each luminous flux R, S of the control and the sample from a light source L are intermitted at frequencies f1, f2 by choppers 1, 2, mixed by a beam mixer 3, made incident to a spectroscope M, detected by a detector D and discriminated by selective amplifiers Sr, Ss. Said lights are integrated by integrators Ir, Is and taken into a CPU. Scanning and data processings of the spectroscope M are performed by wave number unit, integer times of wave number is taken as an integral interval, outputs of the amplifiers Sr, Ss are integrated to obtain the ratio i.e. a transmissivity, and the transmissivity is obtained at every wave number by interpolating method from values of front and rear ends of the integral interval in the midway thereof. Thus, the influence of absorption, etc. of atmospheric components can be eliminated.
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Patent Agency Ranking
公开(公告)号：JPS5636052A
公开(公告)日：1981-04-09
申请号：JP11208679
申请日：1979-08-31
Applicant: SHIMADZU CORP
Inventor： TAKEMURA KUNIHIKO , TOKUHARA YASUTAKA , HORIO KATSUO
IPC: G01N33/536 , G21H5/02
Abstract: PURPOSE:To automatically select an optimum approximate curve and perform data processing in the multiitem radioimmunoassay by using the signals of the inspection items attached to test tubes. CONSTITUTION:An inspection item number (ID number) is attached to each leading one of the test tubes divided into groups, for example, from the first to the fifth group for each inspection item. Parameters for measurement, approximate curves to be applied and the like corresponing to the ID numbers are previously stored in a computer. The test tubes are fed in the direction of arrows, and the ID number attached to the first tube in the first group is read by a sensor S, which sends a signal to the computer. Then the radioactive value obtained by measuring the test tubes at a measuring position P of a well counter is sent to the computer, which performs data processing in the manner specified by said ID number. Said procedure is repeated for the other groups successively. Thus the multiitem inspection is automatically performed.
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公开(公告)号：JPH0522856B2
公开(公告)日：1993-03-30
申请号：JP24832983
申请日：1983-12-26
Applicant: SHIMADZU CORP
Inventor： TOKUHARA YASUTAKA , NAKAMURA KENJI
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公开(公告)号：JPS6146136B2
公开(公告)日：1986-10-13
申请号：JP2111277
申请日：1977-02-28
Applicant: SHIMADZU CORP
Inventor： OIKAWA SHIRO , TOKUHARA YASUTAKA
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公开(公告)号：JPS6070318A
公开(公告)日：1985-04-22
申请号：JP17965683
申请日：1983-09-27
Applicant: SHIMADZU CORP
Inventor： TOKUHARA YASUTAKA , NAKAMURA KENJI
Abstract: PURPOSE:To perform readjustment arbitrarily and to make it possible to perform measurement at the maximum sensitivity all the time, by omitting the position adjustment of a photocoupler for maximizing sensitivity so as to omit the succeeding adjustment work of the photocoupler on the user side. CONSTITUTION:A wedge W is put in and taken out of reference luminous flux (r) so that the detected outputs of the reference light (r) and sample light S become equal, i.e., the synchronized rectified outputs become zero. The amount of the movement of the wedge is made to be the measured output. The output light of a monochrometer 4 is inputted into an infrared-ray detector 5. Its output is amplified by an amplifier 6 and synchronously rectified by a synchronous rectifier circuit 7. The rectified output is inputted to a servo controller 12. In correspondence with said input signal, a servomotor M is driven and the wedge W is moved in and out so that the input signal to the servo controller becomes zero. The driving amount of the wedge W is converted into a voltage signal by a potentiometer P and recorded as absorption spectrum of the sample. Since the position adjustment of the photocoupler is not necessary, readjustment can be performed arbitrarily, and the measurement can be always performed at the maximum sensitivity.
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公开(公告)号：JPS5935170A
公开(公告)日：1984-02-25
申请号：JP14564282
申请日：1982-08-23
Applicant: Shimadzu Corp
Inventor： TOKUHARA YASUTAKA , AZUMA YOSHIBUMI , SUGANO IWAO
CPC classification number: G01T1/2985
Abstract: PURPOSE:To enhance the detection preciseness with respect to time delays of all detectors, by automatically performing the comparative correction of a delay time by the delay circuit of the detector of a ring shaped dose source and the delay circuit of a reference detector at the time of correction. CONSTITUTION:At the time of correction, rihg shaped dose sources 90 containing radioactive isotopes (RI) are present inside detectors 11, 12 and a reference detector 10 is arranged to the central part thereof. The output of the detector 10 is sent to coincidence circuits 41, 42 through a pulse height analyser 20 and a delay circuit 30 and compared to output sent to the circuits 41, 42 from the detectors 11, 12 through height analysers 21, 22 and delay circuits 31, 32 to detect coincidence. Therefore, the distribution of a count value to a delay time is obtained. As the result, correction with respect to time delays of output signal systems of all detectors can be automatically and simply performed.
Abstract translation: 目的：为了提高所有检测器的时间延迟的检测精度，通过自动执行环状剂量源的检测器的延迟电路和当时参考检测器的延迟电路的延迟时间的比较校正 的修正。 构成：在校正时，在检测器11,12内存在含有放射性同位素（RI）的rigg形状的剂量源90，并且在其中央部分设置有参考检测器10。 检测器10的输出通过脉冲高度分析器20和延迟电路30被发送到符合电路41,42，并与从检测器11,12通过高度分析器21,22发送到电路41,42的输出进行比较，并延迟 电路31,32检测重合。 因此，获得计数值到延迟时间的分配。 结果，可以自动且简单地执行关于所有检测器的输出信号系统的时间延迟的校正。
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