Illuminator system for use in spectrophotometer
    1.
    发明授权
    Illuminator system for use in spectrophotometer 失效
    用于分光光度计的照明系统

    公开(公告)号:US3712738A

    公开(公告)日:1973-01-23

    申请号:US3712738D

    申请日:1971-03-10

    Applicant: SHIMADZU CORP

    Inventor: YAMAMOTO H

    CPC classification number: G01J3/08 G01J3/427

    Abstract: An illuminator system for use in a spectrophotometer by which the mode of operation can be easily changed in a simple manner. To this end, means for shielding either of the beams emerged from respective monochromatic beam generators and means for shielding, when said first mentioned means is in the inoperative condition, the other of said beams that has passed through the sector diaphragm. By operating the above mentioned two means, the double wavelength, single beam spectrophotometer can be used as a single wavelength dual beam spectrophotometer and vice versa.

    Abstract translation: 一种用于分光光度计的照明器系统,通过该照明器系统可以简单地容易地改变操作模式。 为此,当所述第一提及的装置处于不工作状态时,屏蔽来自各个单色光束发生器的任何一个光束的装置和用于屏蔽的装置,已经通过扇形光阑的所述光束中的另一个。 通过操作上述两种方法,双波长单光束分光光度计可用作单波长双光束分光光度计,反之亦然。

    2.
    发明专利
    未知

    公开(公告)号:SE422626B

    公开(公告)日:1982-03-15

    申请号:SE7509162

    申请日:1975-08-15

    Applicant: SHIMADZU CORP

    Abstract: Method and apparatus for densitometry wherein a sample spot developed on a supporting medium is scanned by monochromatic light in a zigzag way, and at a predetermined point outside the spot in each scanning stroke the measured output is periodically sampled and stored so as to be subtracted from the measured output during the scanning stroke for correction of the base line of the measured output.

    3.
    发明专利
    未知

    公开(公告)号:SE7509162L

    公开(公告)日:1976-03-01

    申请号:SE7509162

    申请日:1975-08-15

    Applicant: SHIMADZU CORP

    Abstract: Method and apparatus for densitometry wherein a sample spot developed on a supporting medium is scanned by monochromatic light in a zigzag way, and at a predetermined point outside the spot in each scanning stroke the measured output is periodically sampled and stored so as to be subtracted from the measured output during the scanning stroke for correction of the base line of the measured output.

    4.
    发明专利
    未知

    公开(公告)号:SE7508184L

    公开(公告)日:1976-02-23

    申请号:SE7508184

    申请日:1975-07-17

    Applicant: SHIMADZU CORP

    Abstract: Densitometer for quantitative determination of the content of a sample spot on a TLC plate or the like, wherein dualwavelength zigzag scanning is conducted on the spot. Light reflected and transmitted by the sample is received by photometers, and compensation based on Kubelka-Munk's theoretical equations is made on the photometer output so that the output is substantially proportional to the quantity of the substance in the spot being scanned.

Patent Agency Ranking