3.
    发明专利
    失效

    公开(公告)号:JPH05332897A

    公开(公告)日:1993-12-17

    申请号:JP13681392

    申请日:1992-05-28

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To contrive miniaturization of the device and uniformly perform mixture of a power specimen and a fusing agent by attaching a vibration mechanism to an arm for crucible holding of a crucible carrying device. CONSTITUTION:When a powder specimen and a fusing agent are thrown into a cone-shaped crucible (p) by the use of a carrying-in mechanism, the crucible carrying-in device is moved up to a set position of a throwing-into mechanism and the crucible is mounted on crucible mounting plates 9a, 9b with a lifter and a cylinder mechanism 3. A crucible holding arm 5 is positioned at edge parts of a pair of piston axes 4a, 4b. Next, voltage is applied to piezo-elements 11a, 11b of vibration mechanisms 10a, 10b in a condition to hold the crucible (p) on the mounting plates 9a, 9b. Thereby the mounting plates 9a, 9b and receiving tools 8a, 8b are vertically moved along rails for slide 7a, 7b, the crucible (p) is vibrated therewith and the power specimen and the fusing agent are mixed therein. At the time the applied voltage of the piezo-elements 11a, 11b is regulated, so that they are controlled so that they may be mixed uniformly.

    AUTOMATICALLY AGITATING DEVICE
    4.
    发明专利

    公开(公告)号:JPH04190838A

    公开(公告)日:1992-07-09

    申请号:JP32415190

    申请日:1990-11-26

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To simplify a control mechanism and facilitate forward running and reverse running by providing a shape memory alloy and a colder which blows air against the shape memory alloy on a cylinder, on the end of which an axis is rotatably mounted. CONSTITUTION:At first, a shape memory alloy is in a stretched state at a warm temperature. When the shape memory alloy 1 is energized by means of a current controller 5, the alloy 1 is heated gradually and a propeller 4 begins to rotate. Next, the controller 5 is turned off so that cooling air is blown against the alloy 1 from a colder 8. And then the alloy 1 returns to a twisted state, so that the propeller begins to rotate in a reverse direction. By heating and cooling the alloy 1 repeatedly, the propeller 4 put in a liquid rotates in forward and reverse directions so that a solution is agitated sufficiently. The shape memory alloy at first can be put in a twisted state at warm temperature or in stretched state at room temperature and set temperatures for change of state can be varied.

    AUTOMATIC APPARATUS FOR X-RAY ANALYSIS OF CRYSTAL ORIENTATION

    公开(公告)号:JPH04225152A

    公开(公告)日:1992-08-14

    申请号:JP40712890

    申请日:1990-12-27

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To shorten a time for analysis of crystal orientation and also to improve the precision in analysis. CONSTITUTION:After a sample 4 is fixed on a sample stage 5, an X-ray is applied thereto from an X-ray generating device 1, while a position detecting type proportional counter tube 3 is rotated at each prescribed time by a prescribed angle around the sample. During the rotation of the counter tube 3, an angle of incidence of the X-ray and data on a counting rate from the position detecting type proportional counter tube 3 are inputted to a data processing device 8, and the index of a crystal face is determined from an angular relationship on the basis of exponential data in each crystal structure and displayed in CRT 9.

    DIFFRACTION GRATING TYPE SPECTROMETER

    公开(公告)号:JPH05118921A

    公开(公告)日:1993-05-14

    申请号:JP27975491

    申请日:1991-10-25

    Applicant: SHIMADZU CORP

    Abstract: PURPOSE:To make it possible to easily repeat slight movement of an inlet slit at high speed and precisely maintain the angle position shifting by a slight distance by increasing and decreasing the thickness of a piezoelectric ceramic material by changing the voltage to be applied. CONSTITUTION:The side face of a slit holder is pressed 5a by rotating and moving a scanning dial 5 forward and an impulse plate 2 is moved to shift an inlet slit plate S1 and select a prescribed wavelength to be measured. Here, in the case the voltage to be applied to a piezoelectric ceramic material 12, is changed, the thickness of the material 12 is increased and decreased and corresponding to this, swinging 10 occurs. Consequently, pressing force to the side face of a holder 1 becomes strong and weak through a touching material 11 and the plate 2 moves along the tangent line direction L of Row-land circle R by a slight distance corresponding to the alteration of the thickness of the material 12. Following this, the wavelength of the light transmitted through a plate S1 is made different from the selected wavelength to be measured and the spectrum of the different wavelength comes in to an outlet slit plate S2. As a result, the intensity of the spectrum of the wavelength to be measured and the intensity of the background of the shifted wavelength before and after the wavelength are measured repeatedly.

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