公开(公告)号：US20170123879A1

公开(公告)日：2017-05-04

申请号：US15336628

申请日：2016-10-27

Applicant: SILICON GRAPHICS INTERNATIONAL CORP.

Inventor： Pat Donlin

IPC: G06F11/07

CPC classification number: G06F11/079 ,  G06F11/0727 ,  G06F11/073 ,  G06F11/0754 ,  G06F11/0775 ,  G06F11/0781 ,  G06F11/0787 ,  G06F11/0793 ,  G06F11/1048

Abstract: The present disclosure relates to an apparatus and a method for collecting failure/error history lists to identify and categorize erring memory locations in randomly accessible memory of a computer system. Method and apparatus consistent with the present disclosure may identify whether particular memory cells, rows of memory cells, or columns of memory cells within a memory device are associated with transient or persistent errors. These methods and apparatus may also avoid using portions of memory that have been associated with persistent errors or failures.